Patents by Inventor Garen Vartanian

Garen Vartanian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of monitoring photoactive organic molecules in-situ during gas-phase deposition of the photoactive organic molecules
    Patent number: 9062368
    Abstract: A method for in-situ monitoring of gas-phase photoactive organic molecules in real time while depositing a film of the photoactive organic molecules on a substrate in a processing chamber for depositing the film includes irradiating the gas-phase photoactive organic molecules in the processing chamber with a radiation from a radiation source in-situ while depositing the film of the one or more organic materials and measuring the intensity of the resulting photoluminescence emission from the organic material. One or more processing parameters associated with the deposition process can be determined from the photoluminescence intensity data in real time providing useful feedback on the deposition process.
    Type: Grant
    Filed: October 16, 2012
    Date of Patent: June 23, 2015
    Assignee: The Regents of the University of Michigan
    Inventors: Stephen R. Forrest, Garen Vartanian, Cedric Rolin
  • METHOD OF MONITORING PHOTOACTIVE ORGANIC MOLECULES IN-SITU DURING GAS-PHASE DEPOSITION OF THE PHOTOACTIVE ORGANIC MOLECULES
    Publication number: 20140106062
    Abstract: A method for in-situ monitoring of gas-phase photoactive organic molecules in real time while depositing a film of the photoactive organic molecules on a substrate in a processing chamber for depositing the film includes irradiating the gas-phase photoactive organic molecules in the processing chamber with a radiation from a radiation source in-situ while depositing the film of the one or more organic materials and measuring the intensity of the resulting photoluminescence emission from the organic material. One or more processing parameters associated with the deposition process can be determined from the photoluminescence intensity data in real time providing useful feedback on the deposition process.
    Type: Application
    Filed: October 16, 2012
    Publication date: April 17, 2014
    Applicant: The Regents of the University of Michigan
    Inventors: Stephen R. Forrest, Garen Vartanian, Cedric Rolin