Abstract: The present disclosure includes systems, methods, and computer-readable mediums for discovering capabilities of a hardware (HW) accelerator card. A processor may communicate a request for a listing of acceleration services to a HW accelerator card connected to the processor via the communication interface. The HW accelerator card may retrieve the listing from memory and provide a response to the processor that includes a listing of the HW acceleration services provided by the HW accelerator card.

Abstract: A method for characterizing terahertz radiation using spectral domain interferometry, comprising overlapping a pump beam and a terahertz beam in a detecting crystal; obtaining two probe pulses by propagating the probe beam into a polarization maintaining single-mode optical fiber after the detecting crystal; and measuring a change in the optical path difference between the two probe pulses. The system comprises a detection crystal, where a terahertz pulse and a probe beam are made to overlap; a polarization-maintaining optical fiber propagating the probe beam after the detection crystal and outputting two probe pulses; and a spectrometer where the two probe pulses interfere.

Abstract: A single-shot terahertz imaging system including an interferometer and a terahertz spectrometer. The interferometer includes a beam splitter configured to receive input terahertz radiation and output first terahertz radiation and second terahertz radiation, a sample configured to reflect the first terahertz radiation, and a mirror configured to reflect the second terahertz radiation. The beam splitter is further configured to receive the reflected first terahertz radiation and the reflected second terahertz radiation, and output interfered terahertz radiation. The terahertz spectrometer is configured to measure the interfered terahertz radiation and includes a frequency dispersive element configured to receive the interfered terahertz radiation and output spatially dispersed terahertz radiation, and a terahertz radiation detector configured to determine the intensity of the spatially dispersed terahertz radiation.

Abstract: A method for characterizing terahertz radiation using spectral domain interferometry, comprising overlapping a pump beam and a terahertz beam in a detecting crystal; obtaining two probe pulses by propagating the probe beam into a polarization maintaining single-mode optical fiber after the detecting crystal; and measuring a change in the optical path difference between the two probe pulses. The system comprises a detection crystal, where a terahertz pulse and a probe beam are made to overlap; a polarization-maintaining optical fiber propagating the probe beam after the detection crystal and outputting two probe pulses; and a spectrometer where the two probe pulses interfere.

Abstract: A single-shot terahertz imaging system including an interferometer and a terahertz spectrometer. The interferometer includes a beam splitter configured to receive input terahertz radiation and output first terahertz radiation and second terahertz radiation, a sample configured to reflect the first terahertz radiation, and a mirror configured to reflect the second terahertz radiation. The beam splitter is further configured to receive the reflected first terahertz radiation and the reflected second terahertz radiation, and output interfered terahertz radiation. The terahertz spectrometer is configured to measure the interfered terahertz radiation and includes a frequency dispersive element configured to receive the interfered terahertz radiation and output spatially dispersed terahertz radiation, and a terahertz radiation detector configured to determine the intensity of the spatially dispersed terahertz radiation.

Abstract: A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898? can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (?/2).

Abstract: A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898? can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (?/2).

Abstract: Apparatus, method and data processing for increasing the depth range and signal to noise ratio (SNR) in Fourier domain low coherence interferometry (FD LCI) and in Fourier domain optical coherence tomography (FD OCT) using a 2 dimensional (2D) detector array is provided. The depth range and the noise of the FD LCI and FD OCT depend on the number of pixels in the detector that are used for imaging. As the depth range is proportional and the noise is inversely proportional to the number of pixels, the use of increased number of pixels of a 2D detector array increases the depth range and the signal to noise ratio (SNR) many fold.