Patents by Inventor Garrett Headrick

Garrett Headrick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250067525
    Abstract: A sensing device for a metrology system includes a measurement region and a body. The body includes at least one light source adapted to emit a light onto a workpiece, and at least one sensor arranged to receive light from the light source after it has been reflected by the workpiece. The sensing device further includes at least one heat exchanger having an inlet and an outlet for exchanging heat between the measurement region and an outside of the measurement region.
    Type: Application
    Filed: August 21, 2023
    Publication date: February 27, 2025
    Inventors: Levi GROHS, Brian HENEGHAN, James GUNDERSEN, Umesha HANUMANTHAPPA, Raghavendra TIPPANNA, Garrett HEADRICK, Keith DAVIS, Clint VANDERGIESSEN
  • Patent number: 12146736
    Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.
    Type: Grant
    Filed: June 23, 2022
    Date of Patent: November 19, 2024
    Assignee: INDUSTRIAL METROLOGY SOLUTIONS LLC
    Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
  • Patent number: 11486689
    Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.
    Type: Grant
    Filed: February 4, 2020
    Date of Patent: November 1, 2022
    Assignee: DWFritz Automation, Inc.
    Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
  • Publication number: 20220316851
    Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.
    Type: Application
    Filed: June 23, 2022
    Publication date: October 6, 2022
    Applicant: DWFritz Automation, Inc.
    Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
  • Publication number: 20200209021
    Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.
    Type: Application
    Filed: February 4, 2020
    Publication date: July 2, 2020
    Applicant: DWFritz Automation, Inc.
    Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
  • Patent number: 10598521
    Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: March 24, 2020
    Assignee: DWFritz Automation, Inc.
    Inventors: Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vandergiessen
  • Publication number: 20190265012
    Abstract: Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.
    Type: Application
    Filed: February 28, 2019
    Publication date: August 29, 2019
    Applicant: DWFritz Automation, Inc.
    Inventors: Derek Aqui, Mark Baker, Chris Barnes, Robert Batten, Shawn Boling, Jared Greco, Garrett Headrick, Clint Vanderglessen