Abstract: In one embodiment, a tribometer comprises: an infrared (IR) transparent and optically transparent disk coupled to a platform, the disk having an observation side disk surface on an observation side of the disk and a contact side disk surface on a contact side of the disk; a motor coupled to the disk to rotate the disk around a rotational axis of the disk; a pivot support coupled to the platform; a pivoting member connected to the pivot support to pivot along a pivot plane; a sample holder configured to hold a sample and be coupled with the pivoting member to place the sample in contact with the contact side disk surface of the disk; and an IR camera and an optical microscope disposed on the observation side of the disk to observe the sample in sliding contact with the contact side disk surface of the disk driven in rotation.

Abstract: One embodiment is directed to a method of testing a polycrystalline laminate formed on a substrate surface of a substrate which is mounted to a sample holder. The substrate surface includes a substrate length edge having a substrate length and a substrate width edge having a substrate width. The polycrystalline laminate has a notch extending beyond the substrate width edge of the substrate surface. The method comprises at least one of: for tensile cleavage testing, applying a tensile load on the notch of the polycrystalline laminate in a direction generally perpendicular to the substrate surface and away from the substrate surface; and for shear sliding testing, applying a shear load on the end of the polycrystalline laminate in a length direction generally parallel to the substrate length edge of the substrate surface. A notch edge formation piece and a notch end formation piece may be used to form the laminate.

Abstract: In one embodiment employing a vertical draw apparatus, a method of crystallization growth on a substrate surface of a substrate having a substrate material includes: mounting the substrate to a sample holder with the substrate surface facing a liquid surface of a reservoir disposed in a chamber that provides an ambient temperature; seeding the substrate surface with seed droplets; lowering the substrate surface to the liquid surface of the reservoir; independently controlling a temperature of the substrate and a temperature of the reservoir to produce a temperature difference between the substrate and the reservoir over a period of time for crystallization growth; and retracting the substrate surface from the liquid surface of the reservoir at a draw rate. The draw rate and the temperature difference are selected to grow polycrystalline laminate on the substrate surface. Consistent polycrystalline columnar microstructures are formed with appropriate seeding of the substrate surface.

Abstract: In one embodiment, a tribometer comprises: an infrared (IR) transparent and optically transparent disk coupled to a platform, the disk having an observation side disk surface on an observation side of the disk and a contact side disk surface on a contact side of the disk; a motor coupled to the disk to rotate the disk around a rotational axis of the disk; a pivot support coupled to the platform; a pivoting member connected to the pivot support to pivot along a pivot plane; a sample holder configured to hold a sample and be coupled with the pivoting member to place the sample in contact with the contact side disk surface of the disk; and an IR camera and an optical microscope disposed on the observation side of the disk to observe the sample in sliding contact with the contact side disk surface of the disk driven in rotation.

Abstract: One embodiment is directed to a method of testing a polycrystalline laminate formed on a substrate surface of a substrate which is mounted to a sample holder. The substrate surface includes a substrate length edge having a substrate length and a substrate width edge having a substrate width. The polycrystalline laminate has a notch extending beyond the substrate width edge of the substrate surface. The method comprises at least one of: for tensile cleavage testing, applying a tensile load on the notch of the polycrystalline laminate in a direction generally perpendicular to the substrate surface and away from the substrate surface; and for shear sliding testing, applying a shear load on the end of the polycrystalline laminate in a length direction generally parallel to the substrate length edge of the substrate surface. A notch edge formation piece and a notch end formation piece may be used to form the laminate.

Abstract: In one embodiment employing a vertical draw apparatus, a method of crystallization growth on a substrate surface of a substrate having a substrate material includes: mounting the substrate to a sample holder with the substrate surface facing a liquid surface of a reservoir disposed in a chamber that provides an ambient temperature; seeding the substrate surface with seed droplets; lowering the substrate surface to the liquid surface of the reservoir; independently controlling a temperature of the substrate and a temperature of the reservoir to produce a temperature difference between the substrate and the reservoir over a period of time for crystallization growth; and retracting the substrate surface from the liquid surface of the reservoir at a draw rate. The draw rate and the temperature difference are selected to grow polycrystalline laminate on the substrate surface. Consistent polycrystalline columnar microstructures are formed with appropriate seeding of the substrate surface.