Abstract: A method of yield improvement for manufactured products includes providing an identification plan for parts and processing equipment, whereby each part and each piece of equipment is given unique and traceable identification data. A database is provided into which the parts identification data and the processing equipment identification data are stored, and related. The parts are processed in at least one processing stage by the processing equipment to yield processed parts, and the processed parts are tested for defects. Problems are then identified through the testing of the processed parts. The related parts identification data and the processing equipment identification data are retrieved from the database, and the data is analyzed to trace the parts to the appropriate processing equipment. Corrections and repairs are made to the processing equipment to correct the problems. Improvement to yield of the manufactured products is then confirmed.

Abstract: A method is presented for controlling process delay times between a) thin film deposition and lubricant application, and b) lubricant application and abrasive polishing. Applicants have discovered that for certain lubricants, a minimum delay time after the overcoat has been deposited before the lubricant is applied increases the number of disks passing the glide test after abrasive polishing. In addition, applicants have discovered that for certain lubricants, the abrasive polishing should take place within a maximum time window following the application of the lubricant. A computerized work-in-progress tracking system is preferably used to implement the method of the invention.

Abstract: A method for identifying a problem with a magnetic disk, comprising testing both sides of a disk for read errors using a pair of heads, flipping the disk 180 degrees, again testing both sides of the disk for read errors using the same heads, determining whether one side of the disk has more errors than the other side both before and after the flip, and determining that the disk is the cause of the read errors if the same side of the disk still has more errors than the other side after the flip.