Abstract: A system for identifying and sorting integrated circuit devices based on an encrypted Fuse ID information such as manufacturing and test information stored in the integrated circuit device, includes a test fixture for receiving an integrated circuit device to be identified and sorted. The system further includes a portable, user friendly processor communicatively coupled to the test fixture to read the stored encrypted device identification data from the integrated circuit device and decrypt the read encrypted Fuse ID information, and to compare the decrypted device identification data to a previously entered sort criteria and to identify and sort the integrated circuit device based on the outcome of the comparison.

Abstract: Catalyst compositions for use in forming polyurethane products include a gelling catalyst, a trimerization catalyst, and a cure accelerator. The gelling catalyst is a tertiary amine, mono(tertiary amino) urea, bis(tertiary amino) urea, or a combination of any of these. Any known trimerization catalyst may be used. The cure accelerator may be a diol having at least one primary hydroxyl group, and having from five to 17 chain backbone atoms chosen from carbon, oxygen, or both between the hydroxyl groups, provided that at least five of the backbone atoms are carbon. Alternatively or in addition, the cure accelerator may be a polyol having three or more hydroxyl groups, at least two of which are primary, and having molecular weights between 90 g/mole and 400 g/mole. Delayed initiation of the polyurethane-forming reaction and/or reduced demold time for producing the polyurethane part can be obtained by using these catalyst compositions.

Abstract: Catalyst compositions for use in forming polyurethane products include a gelling catalyst, a trimerization catalyst, and a cure accelerator. The gelling catalyst is a tertiary amine, mono(tertiary amino) urea, bis(tertiary amino) urea, or a combination of any of these. Any known trimerization catalyst may be used. The cure accelerator may be a diol having at least one primary hydroxyl group, and having from five to 17 chain backbone atoms chosen from carbon, oxygen, or both between the hydroxyl groups, provided that at least five of the backbone atoms are carbon. Alternatively or in addition, the cure accelerator may be a polyol having three or more hydroxyl groups, at least two of which are primary, and having molecular weights between 90 g/mole and 400 g/mole. Delayed initiation of the polyurethane-forming reaction and/or reduced demold time for producing the polyurethane part can be obtained by using these catalyst compositions.

Abstract: A method for making a rigid polyurethane foam by reacting a polyisocyanate and a polyol in the presence of a urethane catalyst, a blowing agent and a silicone surfactant characterized by employing a blowing agent comprising a C4 or C5 hydrocarbon, or mixtures thereof, with an average molecular weight of ?72 g/mole and a boiling point in the range of 27.8 to 50 ° C., and a silicone surfactant comprising a polyether-polysiloxane copolymer represented by the following formula: (CH3)3—Si—O—(Si(CH3)2—O)x—(Si(CH3)(R)O)y—Si(CH3)3 where R?(CH2)3—O—(—CH2—CH2—O)a—(CH2—CH(CH3)—O)b—R?, and where R? is H, (CH2)ZCH3, or C(O)CH3; x+y+2 is 60-130; x/y is 5-14; z is 0-4; the total surfactant molecular weight, based on the formula, is 7000-30,000 g/mole, the wt % siloxane in the surfactant is 32-70 wt %, the blend average molecular weight (BAMW) of the polyether portion is 450-1000 g/mole, and the mole % of ethylene oxide in the polyether portion is 70-100 mole %.

Abstract: An apparatus that can determine whether a Tva parameter and a Tvb parameter of a device under test (DUT) complies with a design specification where the device under test is coupled to a secondary device. The Tvb parameter corresponds to a setup time of the secondary device. The Tva parameter corresponds to the hold time of the secondary device. The apparatus allows the DUT to be coupled to a secondary device that normally operates with the DUT. The apparatus writes data to the DUT and secondary device. The data is then written back to the apparatus which then determines whether the DUT complies with the Tvb and Tva design specifications. The apparatus may also implement tunable delay circuits to compensate for different setup and hold times of the secondary device.