Patents by Inventor Gary Behm

Gary Behm has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12267457
    Abstract: A system and method for enhancing communication between multiple parties includes a first user accessing a communication device; initiating a communication connection to a receiving communication device of a second user; and wherein at least one of the communication devices includes a list of enabled universal communication attributes of the user, utilizing one or more of the enabled communication attributes to complete the communication connection between the initiating and receiving communication devices. A user can select a desired communication attribute or multiple attributes which can be stored in the user's profile. The enabled attributes can be utilized by a network accessing the user's profile to complete the communication connection.
    Type: Grant
    Filed: April 19, 2021
    Date of Patent: April 1, 2025
    Assignee: Rochester Institute of Technology
    Inventors: Gary Behm, Brian Trager, Shareef Ali, Mark Jeremy, Byron Behm
  • Publication number: 20210243298
    Abstract: A system and method for enhancing communication between multiple parties includes a first user accessing a communication device; initiating a communication connection to a receiving communication device of a second user; and wherein at least one of the communication devices includes a list of enabled universal communication attributes of the user, utilizing one or more of the enabled communication attributes to complete the communication connection between the initiating and receiving communication devices. A user can select a desired communication attribute or multiple attributes which can be stored in the user's profile. The enabled attributes can be utilized by a network accessing the user's profile to complete the communication connection.
    Type: Application
    Filed: April 19, 2021
    Publication date: August 5, 2021
    Applicant: Rochester Institute of Technology
    Inventors: Gary Behm, Brian Trager, Shareef Ali, Mark Jeremy, Byron Behm
  • Patent number: 11012559
    Abstract: A system and method for enhancing communication between multiple parties includes a first user accessing a communication device; initiating a communication connection to a receiving communication device of a second user; and wherein at least one of the communication devices includes a list of enabled universal communication attributes of the user, utilizing one or more of the enabled communication attributes to complete the communication connection between the initiating and receiving communication devices. A user can select a desired communication attribute or multiple attributes which can be stored in the user's profile. The enabled attributes can be utilized by a network accessing the user's profile to complete the communication connection.
    Type: Grant
    Filed: February 14, 2020
    Date of Patent: May 18, 2021
    Assignee: Rochester Institute of Technology
    Inventors: Gary Behm, Brian Trager, Shareef Ali, Mark Jeremy, Byron Behm
  • Publication number: 20200267259
    Abstract: A system and method for enhancing communication between multiple parties includes a first user accessing a communication device; initiating a communication connection to a receiving communication device of a second user; and wherein at least one of the communication devices includes a list of enabled universal communication attributes of the user, utilizing one or more of the enabled communication attributes to complete the communication connection between the initiating and receiving communication devices. A user can select a desired communication attribute or multiple attributes which can be stored in the user's profile. The enabled attributes can be utilized by a network accessing the user's profile to complete the communication connection.
    Type: Application
    Filed: February 14, 2020
    Publication date: August 20, 2020
    Applicant: Rochester Institute of Technology
    Inventors: Gary Behm, Brian Trager, Shareef Ali, Mark Jeremy, Byron Behm
  • Publication number: 20080032428
    Abstract: A method and system for controlling a dimension of an etched feature. The method includes: measuring a mask feature formed on a top surface of a layer on a substrate to obtain a mask feature dimension value; and calculating a mask trim plasma etch time based on the mask feature dimension value, a mask feature dimension target value, a total of selected radio frequency power-on times of a plasma etch tool since an event occurring to a chamber or chambers of a plasma etch tool for plasma etching the layer, and an etch bias target for a layer feature to be formed from the layer where the layer is not protected by the mask feature during a plasma etch of the layer.
    Type: Application
    Filed: October 15, 2007
    Publication date: February 7, 2008
    Inventors: Gary Behm, Teresita Magtoto, Rajiv Ranade
  • Publication number: 20070038326
    Abstract: Integration of factory level advanced process control (FL-APC) system and tool level advanced process control (TL-APC) system using selectable APC operation modes indicating different operational settings for the FL-APC system and at least one TL-APC system is disclosed. During operation, the FL-APC system controls operation of the TL-APC system. The invention allows a manufacturing execution system (MES) to have additional capability to run the process control functions at FL-APC system and/or TL-APC system, and allows integration of a variety of different tools with a TL-APC system. An implementation method, system and program product are also disclosed.
    Type: Application
    Filed: July 27, 2006
    Publication date: February 15, 2007
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Gary Behm, Emily Hwang, Yue Li, Teresita Magtoto
  • Publication number: 20060255010
    Abstract: A method and system for controlling a dimension of an etched feature. The method includes: measuring a mask feature formed on a top surface of a layer on a substrate to obtain a mask feature dimension value; and calculating a mask trim plasma etch time based on the mask feature dimension value, a mask feature dimension target value, a total of selected radio frequency power-on times of a plasma etch tool since an event occurring to a chamber or chambers of a plasma etch tool for plasma etching the layer, and an etch bias target for a layer feature to be formed from the layer where the layer is not protected by the mask feature during a plasma etch of the layer.
    Type: Application
    Filed: May 10, 2005
    Publication date: November 16, 2006
    Applicant: International Business Machines Corporation
    Inventors: Gary Behm, Teresita Magtoto, Rajiv Ranade