Patents by Inventor Gary Blanpied
Gary Blanpied has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10228486Abstract: Techniques and systems for two scanners to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.Type: GrantFiled: August 22, 2016Date of Patent: March 12, 2019Assignee: Decision Sciences International CorporationInventors: Michael James Sossong, Shawn McKenney, Robert Whalen, Gary Blanpied, Andre Lehovich, Priscilla Kurnadi
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Patent number: 9915626Abstract: Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over a range of low-atomic-mass materials, and to detect and identify content of a volume of interest (VOI) exposed to cosmic-ray charged particles based on the constructed scattering and stopping relationship. In one aspect, a process for constructing a scattering-stopping relationship for a range of low-density materials exposed to cosmic-ray charged particles is disclosed. This technique first determines a scattering parameter and a stopping parameter for each material within the range of low-density materials exposed to charged particles from cosmic ray. The technique then establishes a scattering-stopping relationship of cosmic ray charged particles for the range of low-density materials based on the determined pairs of scattering and stopping parameters associated with the range of low-density materials.Type: GrantFiled: February 26, 2015Date of Patent: March 13, 2018Assignee: Decision Sciences International CorporationInventors: Gary Blanpied, Sankaran Kumar, Dustin Dorroh, Craig Morgan, Michael James Sossong
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Patent number: 9841530Abstract: In one aspect, a process for characterizing a range of materials based on the scattering and stopping of incident cosmic ray charged particles passing through each material includes: determining a scattering metric and a stopping metric for each material within the range of materials exposed to cosmic ray charged particles; computing a ratio of the scattering metric to the stopping metric to obtain a scattering-to-stopping ratio for each material within the range of materials for the material; and establishing a scattering-stopping relationship for the range of materials based on the determined pairs of the scattering-to-stopping ratio and the associated scattering metric for the range of materials.Type: GrantFiled: August 10, 2015Date of Patent: December 12, 2017Assignee: Decision Sciences International CorporationInventors: Gary Blanpied, Sankaran Kumar, Dustin Dorroh, Craig Morgan
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Patent number: 9784859Abstract: A charged particle detector array includes one or more pairs of super modules, one super module in a pair of super modules is positioned above a volume of interest (VOI), and the other super module in the pair of super modules is positioned below the VOI. This calibration technique first calibrates individual super modules in the one or more pairs of super modules while treating each super module being calibrated as a rigid body. Each super module in the one or more pairs of super modules further includes multiple vertically-stacked modules, and each module in the multiple vertically-stacked modules is composed of multiple layers of drift tubes. The calibration technique then calibrates individual modules in each of the super modules while treating each module being calibrated as a rigid body. Next, the calibration technique calibrates individual drift tubes in each layer of the modules.Type: GrantFiled: August 19, 2015Date of Patent: October 10, 2017Assignee: Decision Sciences International CorporationInventors: Gary Blanpied, Michael James Sossong, Shawn McKenney, Thomas Taylor, Kolo Wamba
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Publication number: 20160356913Abstract: Techniques and systems for two scanners to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.Type: ApplicationFiled: August 22, 2016Publication date: December 8, 2016Inventors: Michael James Sossong, Shawn McKenney, Robert Whalen, Gary Blanpied, Andre Lehovich, Priscilla Kurnadi
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Patent number: 9423362Abstract: Techniques and systems for using cosmic ray-produced muons to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.Type: GrantFiled: August 21, 2013Date of Patent: August 23, 2016Assignee: Decision Sciences International CorporationInventors: Michael James Sossong, Shawn McKenney, Robert Whalen, Gary Blanpied, Andre Lehovich, Priscilla Kurnadi
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Publication number: 20160054458Abstract: A charged particle detector array includes one or more pairs of super modules, one super module in a pair of super modules is positioned above a volume of interest (VOI), and the other super module in the pair of super modules is positioned below the VOI. This calibration technique first calibrates individual super modules in the one or more pairs of super modules while treating each super module being calibrated as a rigid body. Each super module in the one or more pairs of super modules further includes multiple vertically-stacked modules, and each module in the multiple vertically-stacked modules is composed of multiple layers of drift tubes. The calibration technique then calibrates individual modules in each of the super modules while treating each module being calibrated as a rigid body. Next, the calibration technique calibrates individual drift tubes in each layer of the modules.Type: ApplicationFiled: August 19, 2015Publication date: February 25, 2016Inventors: Gary Blanpied, Michael James Sossong, Shawn McKenney, Thomas Taylor, Kolo Wamba
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Publication number: 20160041297Abstract: In one aspect, a process for characterizing a range of materials based on the scattering and stopping of incident cosmic ray charged particles passing through each material includes: determining a scattering metric and a stopping metric for each material within the range of materials exposed to cosmic ray charged particles; computing a ratio of the scattering metric to the stopping metric to obtain a scattering-to-stopping ratio for each material within the range of materials for the material; and establishing a scattering-stopping relationship for the range of materials based on the determined pairs of the scattering-to-stopping ratio and the associated scattering metric for the range of materials.Type: ApplicationFiled: August 10, 2015Publication date: February 11, 2016Inventors: Gary Blanpied, Sankaran Kumar, Dustin Dorroh, Craig Morgan
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Publication number: 20150241593Abstract: Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over a range of low-atomic-mass materials, and to detect and identify content of a volume of interest (VOI) exposed to cosmic-ray charged particles based on the constructed scattering and stopping relationship. In one aspect, a process for constructing a scattering-stopping relationship for a range of low-density materials exposed to cosmic-ray charged particles is disclosed. This technique first determines a scattering parameter and a stopping parameter for each material within the range of low-density materials exposed to charged particles from cosmic ray. The technique then establishes a scattering-stopping relationship of cosmic ray charged particles for the range of low-density materials based on the determined pairs of scattering and stopping parameters associated with the range of low-density materials.Type: ApplicationFiled: February 26, 2015Publication date: August 27, 2015Inventors: Gary Blanpied, Sankaran Kumar, Dustin Dorroh, Craig Morgan, Michael James Sossong
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Publication number: 20150212014Abstract: Techniques and systems for using cosmic ray-produced muons to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.Type: ApplicationFiled: August 21, 2013Publication date: July 30, 2015Applicant: Decision Sciences International CorporationInventors: Michael James Sossong, Shawn McKenney, Robert Whalen, Gary Blanpied, Andre Lehovich, Priscilla Kurnadi
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Patent number: 8536527Abstract: Techniques, apparatus and systems for obtaining tomographic images of a volume of interest by using charged particle tomography detection systems.Type: GrantFiled: August 27, 2009Date of Patent: September 17, 2013Assignees: Decision Sciences International Corporation, Los Alamos National Security, LLCInventors: Christopher L. Morris, Larry Joe Schultz, Jesse Andrew Green, Michael James Sossong, Konstantin N. Borozdin, Alexei V. Klimenko, Gary Blanpied, Vladimir Tumakov, Kolo Wamba
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Publication number: 20110248163Abstract: Techniques, apparatus and systems for obtaining tomographic images of a volume of interest by using charged particle tomography detection systems.Type: ApplicationFiled: August 27, 2009Publication date: October 13, 2011Applicants: LOS ALAMOS NATIONAL SECURITY, LLC, DECISION SCIENCES INTERNATIONAL CORPORATIONInventors: Christoper L. Morris, Larry Joe Schultz, Jesse Andrew Green, Michael James Sossong, Konstantin N. Borozdin, Alexei V. Klimenko, Gary Blanpied, Vladimir Tumakov, Kolo Wamba
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Patent number: 7838841Abstract: Methods, apparatus and systems for detecting charged particles and obtaining tomography of a volume by measuring charged particles including measuring the momentum of a charged particle passing through a charged particle detector. Sets of position sensitive detectors measure scattering of the charged particle. The position sensitive detectors having sufficient mass to cause the charged particle passing through the position sensitive detectors to scatter in the position sensitive detectors. A controller can be adapted and arranged to receive scattering measurements of the charged particle from the charged particle detector, determine at least one trajectory of the charged particle from the measured scattering; and determine at least one momentum measurement of the charged particle from the at least one trajectory. The charged particle can be a cosmic ray-produced charged particle, such as a cosmic ray-produced muon. The position sensitive detectors can be drift cells, such as gas-filled drift tubes.Type: GrantFiled: October 24, 2007Date of Patent: November 23, 2010Assignee: Los Alamos National Security, LLCInventors: Christopher Morris, Andrew Mcleod Fraser, Larry Joe Schultz, Konstantin N. Borozdin, Alexei Vasilievich Klimenko, Michael James Sossong, Gary Blanpied
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Publication number: 20080265156Abstract: Methods, apparatus and systems for detecting charged particles and obtaining tomography of a volume by measuring charged particles including measuring the momentum of a charged particle passing through a charged particle detector. Sets of position sensitive detectors measure scattering of the charged particle. The position sensitive detectors having sufficient mass to cause the charged particle passing through the position sensitive detectors to scatter in the position sensitive detectors. A controller can be adapted and arranged to receive scattering measurements of the charged particle from the charged particle detector, determine at least one trajectory of the charged particle from the measured scattering; and determine at least one momentum measurement of the charged particle from the at least one trajectory. The charged particle can be a cosmic ray-produced charged particle, such as a cosmic ray-produced muon. The position sensitive detectors can be drift cells, such as gas-filled drift tubes.Type: ApplicationFiled: October 24, 2007Publication date: October 30, 2008Inventors: Christopher Morris, Andrew Mcleod Fraser, Larry Joe Schultz, Konstantin N. Borozdin, Alexei Vasilievich Klimenko, Michael James Sossong, Gary Blanpied