Abstract: Defects in the manufacturing of IC devices are analyzed by testing the devices for defects, generating a serial digital data bitstream upon which the test result for each device is encoded in succession, and operating upon the data bitstream to analyze the device defects. This allows for the use of rapid and reliable digital signal processing techniques to perform the analysis. The types of analyses that can be performed include the determination of non-random yields to distinguish random from systematic defects, comparisons with signature defect patterns that correspond to various systematic faults, and yield predictions for other circuits manufactured with a similar process but having a different critical circuit area. An improved windowing technique is used to determine non-random defects, in which normalized defect counts are obtained and compared for various window sizes.

Abstract: This invention provides an improved manually operable pour spout for use with a container of liquid, which is accomplished by a manually operable pour spout which is engageable with an opening of a container for dispensing liquid from the container and which has a valve body portion which acts as a sleeve about a conduit having a pouring orifice therein and which provides both opening of the spout and of a vent therein when in a up position and for the closing of both when in a down position.