Abstract: Suspension bands, helmet systems, and/or the like are provided. In some embodiments, a suspension band includes: a plurality of knitted loop structures; and a plurality of knitted inlay structures, wherein the plurality of knitted inlay structures is inserted as a weft inlay stitch on, beneath, or within the plurality of knitted loop structures. In some embodiments, the suspension band includes one or more inlay sections and a reinforcement section; a greater portion of the plurality of knitted loop structures are disposed on, beneath, or within the reinforcement section than are disposed on, beneath, or within the one or more inlay sections. In some embodiments, the one or more inlay sections include a first inlay section and a second inlay section, wherein the first inlay section is disposed on a first side of the reinforcement section and the second inlay section is disposed on a second side of the reinforcement section.

Abstract: Apparatuses are described that provide for a mobile eye washing station. An example station includes a fluid storage cartridge that stores unused eye wash fluid and a nozzle assembly in fluid communication with the fluid storage cartridge. In operation, the nozzle assembly dispenses the unused eye wash fluid stored in the fluid storage cartridge via one or more nozzles of the nozzle assembly. The example station further includes a waste fluid collection basin that, in operation, collects eye wash fluid dispersed by the nozzle assembly. Due to contact with the fluid storage cartridge, the waste fluid collection basin compresses the fluid storage cartridge to drive fluid communication between the fluid storage cartridge and the nozzle assembly. The fluid storage cartridge is disposed vertically beneath the waste fluid collection basin.

Abstract: Apparatuses are described that provide for a mobile eye washing station. An example station includes a fluid storage cartridge that stores unused eye wash fluid and a nozzle assembly in fluid communication with the fluid storage cartridge. In operation, the nozzle assembly dispenses the unused eye wash fluid stored in the fluid storage cartridge via one or more nozzles of the nozzle assembly. The example station further includes a waste fluid collection basin that, in operation, collects eye wash fluid dispersed by the nozzle assembly. Due to contact with the fluid storage cartridge, the waste fluid collection basin compresses the fluid storage cartridge to drive fluid communication between the fluid storage cartridge and the nozzle assembly. The fluid storage cartridge is disposed vertically beneath the waste fluid collection basin.

Abstract: The present invention describes a test structure with a first set of features which is a subset of product features; and a second set of features adjacent to the first set of features, the second set occupying a smaller area than the first set and the second set being similar to the first set yet being distinguishable from surrounding structures.

Abstract: In an embodiment of the present invention, a device includes a first etched feature located in a critical dimension scanning electron microscope (CD-SEM) characterization location, the first etched feature having an upper section, a middle section, and a lower section wherein the middle section is severely shrunk relative to a corresponding middle section of a second etched feature having similar dimensions and composition that is not located in a CD-SEM characterization location. In another embodiment of the present invention, the middle section of the first etched feature has a shrinkage carryover exceeding a threshold. In still another embodiment of the present invention, the middle section of the first etched feature exhibits a line edge roughness.

Abstract: Various embodiments of methods, apparatuses, articles of manufacture, and systems for determining one or more regions of one or more images for modification to remove information, through application of one or more criteria to the one or more images, selecting one or more modifications to be made to the one or more determined regions of the one or more images to remove information, the one or more modifications associated with at least one of the one or more criteria, and locally modifying the one or more regions of the one or more images in accordance with the selected one or more modifications to remove information, are described herein. In other embodiments, a plurality of the images taken under different conditions may be combined to form a composite image.

Abstract: The present invention describes a test structure with a first set of features which is a subset of product features; and a second set of features adjacent to the first set of features, the second set occupying a smaller area than the first set and the second set being similar to the first set yet being distinguishable from surrounding structures.

Abstract: A CD-SEM (critical dimension-scanning electron microscope) system may utilize a technique for characterizing and reducing shrinkage carryover due to CD-SEM measurements. The system may identify the affects of CD-SEM measurements on the resist and adjust the operating parameters for a particular resist to avoid or significantly reduce shrinkage carryover. In this manner, the system may obtain more reliable CD measurements and avoid damage to the measured feature.

Abstract: An optical metrology target is provided and has a first periodic structure and a second periodic structure. The first periodic structure has at least two features and a first pitch, and the second periodic structure has at least two features and a second pitch. The optical metrology target is illuminated with a light source, and an optical signal from the optical metrology target is received and analyzed.

Abstract: The present invention describes a test structure with a first set of features which is a subset of product features; and a second set of features adjacent to the first set of features, the second set occupying a smaller area than the first set and the second set being similar to the first set yet being distinguishable from surrounding structures.

Abstract: The present invention describes a test structure with a first set of features which is a subset of product features; and a second set of features adjacent to the first set of features, the second set occupying a smaller area than the first set and the second set being similar to the first set yet being distinguishable from surrounding structures.

Abstract: The present invention describes a test structure with a first set of features which is a subset of product features; and a second set of features adjacent to the first set of features, the second set occupying a smaller area than the first set and the second set being similar to the first set yet being distinguishable from surrounding structures.