Abstract: To measure a convex mirror, a reference beam and a measurement beam are both provided through a single optical fiber. A positive auxiliary lens is placed in the system to give a converging wavefront onto the convex mirror under test. A measurement is taken that includes the aberrations of the convex mirror as well as the errors due to two transmissions through the positive auxiliary lens. A second measurement provides the information to eliminate this error. A negative lens can also be measured in a similar way. Again, there are two measurement set-ups. A reference beam is provided from a first optical fiber and a measurement beam is provided from a second optical fiber. A positive auxiliary lens is placed in the system to provide a converging wavefront from the reference beam onto the negative lens under test. The measurement beam is combined with the reference wavefront and is analyzed by standard methods.

Abstract: The invention uses the phase shifting diffraction interferometer (PSDI) to provide a true point-by-point measurement of absolute flatness over the surface of optical flats. Beams exiting the fiber optics in a PSDI have perfect spherical wavefronts. The measurement beam is reflected from the optical flat and passed through an auxiliary optic to then be combined with the reference beam on a CCD. The combined beams include phase errors due to both the optic under test and the auxiliary optic. Standard phase extraction algorithms are used to calculate this combined phase error. The optical flat is then removed from the system and the measurement fiber is moved to recombine the two beams. The newly combined beams include only the phase errors due to the auxiliary optic. When the second phase measurement is subtracted from the first phase measurement, the absolute phase error of the optical flat is obtained.

Abstract: To measure a convex mirror, a reference beam and a measurement beam are both provided through a single optical fiber. A positive auxiliary lens is placed in the system to give a converging wavefront onto the convex mirror under test. A measurement is taken that includes the aberrations of the convex mirror as well as the errors due to two transmissions through the positive auxiliary lens. A second measurement provides the information to eliminate this error. A negative lens can also be measured in a similar way. Again, there are two measurement set-ups. A reference beam is provided from a first optical fiber and a measurement beam is provided from a second optical fiber. A positive auxiliary lens is placed in the system to provide a converging wavefront from the reference beam onto the negative lens under test. The measurement beam is combined with the reference wavefront and is analyzed by standard methods.

Abstract: The invention uses the phase shifting diffraction interferometer (PSDI) to provide a true point-by-point measurement of absolute flatness over the surface of optical flats. Beams exiting the fiber optics in a PSDI have perfect spherical wavefronts. The measurement beam is reflected from the optical flat and passed through an auxiliary optic to then be combined with the reference beam on a CCD. The combined beams include phase errors due to both the optic under test and the auxiliary optic. Standard phase extraction algorithms are used to calculate this combined phase error. The optical flat is then removed from the system and the measurement fiber is moved to recombine the two beams. The newly combined beams include only the phase errors due to the auxiliary optic. When the second phase measurement is subtracted from the first phase measurement, the absolute phase error of the optical flat is obtained.

Abstract: To measure a convex mirror, a reference beam and a measurement beam are both provided through a single optical fiber. A positive auxiliary lens is placed in the system to give a converging wavefront onto the convex mirror under test. A measurement is taken that includes the aberrations of the convex mirror as well as the errors due to two transmissions through the positive auxiliary lens. A second, measurement provides the information to eliminate this error. A negative lens can also be measured in a similar way. Again, there are two measurement set-ups. A reference beam is provided from a first optical fiber and a measurement beam is provided from a second optical fiber. A positive auxiliary lens is placed in the system to provide a converging wavefront from the reference beam onto the negative lens under test. The measurement beam is combined with the reference wavefront and is analyzed by standard methods.

Abstract: A visible light method for detecting sub-100 nm size defects on mask blanks used for lithography. By using optical heterodyne techniques, detection of the scattered light can be significantly enhanced as compared to standard intensity detection methods. The invention is useful in the inspection of super-polished surfaces for isolated surface defects or particulate contamination and in the inspection of lithographic mask or reticle blanks for surface defects or bulk defects or for surface particulate contamination.

Abstract: Embedded fiducials are provided in optical surfaces and a method for embedding the fiducials. Fiducials, or marks on a surface, are important for optical fabrication and alignment, particularly when individual optical elements are aspheres. Fiducials are used during the course of the polishing process to connect interferometric data, and the equation describing the asphere, to physical points on the optic. By embedding fiducials below the surface of the optic and slightly outside the clear aperture of the optic, the fiducials are not removed by polishing, do not interfere with the polishing process, and do not affect the performance of the finished optic.

Abstract: A micromachined vertical actuator utilizing a levitational force, such as in electrostatic comb drives, provides vertical actuation that is relatively linear in actuation for control, and can be readily combined with parallel plate capacitive position sensing for position control. The micromachined electrostatic vertical actuator provides accurate movement in the sub-micron to micron ranges which is desirable in the phase modulation instrument, such as optical phase shifting. For example, compact, inexpensive, and position controllable micromirrors utilizing an electrostatic vertical actuator can replace the large, expensive, and difficult-to-maintain piezoelectric actuators. A thirty pound piezoelectric actuator with corner cube reflectors, as utilized in a phase shifting diffraction interferometer can be replaced with a micromirror and a lens.

Abstract: An interferometer which has the capability of measuring optical elements and systems with an accuracy of .lambda./1000 where .lambda. is the wavelength of visible light. Whereas current interferometers employ a reference surface, which inherently limits the accuracy of the measurement to about .lambda./50, this interferometer uses an essentially perfect spherical reference wavefront generated by the fundamental process of diffraction. Whereas current interferometers illuminate the optic to be tested with an aberrated wavefront which also limits the accuracy of the measurement, this interferometer uses an essentially perfect spherical measurement wavefront generated by the fundamental process of diffraction.

Abstract: The present invention is a laser with a high reflector mirror and an output coupler mirror defining a laser resonator having an optical axis and optical path length. A gain medium, with a first refractive index and a first Verdet constant, is positioned in the resonator. The laser also includes an apparatus to excite and cause a population inversion in the gain medium to produce an output laser beam. An optically transparent medium is positioned in the laser resonator. The optically transparent medium has a second refractive index and a second Verdet constant. The second Verdet constant is typically larger than the first Verdet constant. One or more permanent and electromagnets are positioned at least partially around the exterior of the laser resonator.

Abstract: An interferometer which has the capability of measuring optical elements and systems with an accuracy of .lambda./1000 where .lambda. is the wavelength of visible light. Whereas current interferometers employ a reference surface, which inherently limits the accuracy of the measurement to about .lambda./50, this interferometer uses an essentially perfect spherical reference wavefront generated by the fundamental process of diffraction. This interferometer is adjustable to give unity fringe visibility, which maximizes the signal-to-noise, and has the means to introduce a controlled prescribed relative phase shift between the reference wavefront and the wavefront from the optics under test, which permits analysis of the interference fringe pattern using standard phase extraction algorithms.

Abstract: Apparatus is disclosed for the measurement of the distance between a test surface (55) and a plano reference surface (58) which are in close proximity to each other. The preferred way of accomplishing this is with a polarization phase modulated interferometer. The modulated interference pattern is photosensed with an array camera (52), and the signals are processed by a computer (80), which also controls the rotation speed of the rotating glass disk (54) which contains the plano reference surface (58), to provide not only the distance between the test surface (55) and the plano reference surface (58) but also the topography of the test surface (55) independent of the phase changes on reflection from the test surface (55). A method is also disclosed, using the instant invention, for determining the flying height (h) of a slider assembly used in magnetic storage systems.

Abstract: A high accuracy linear displacement interferometer capable of measuring changes in displacement of two plane mirror surfaces (60, 61) comprises a source (10) of an input beam (12) with two linear orthogonally polarized components which may or may not be of the same optical frequency, a birefringent optical element (40) and a quarter-wave phase retardation plate (42) for converting the input beam (12) into two separated, parallel, oppositely handed circularly polarized beams (16, 17); a first plane mirror (60) comprising one of the two (60, 61) plane mirror surfaces; a second plane mirror (61) nominally parallel to and rigidly connected to the first plane mirror (60) surface comprising the other of the two plane mirror surfaces; the birefringent optical element (40), the quarter-wave phase retardation plate (42), a right angle prism (48) with reflective, orthogonal faces, and a pair of retroreflectors (44, 45) causing each of the separated, parallel, oppositely handed circularly polarized output beams (32, 33)

Abstract: An angular displacement interferometer system capable of measuring accurately changes in angular displacement comprises a source (10) of a frequency stabilized input beam with two linear orthogonally polarized components; a tilted parallel plate or shear place (16) with regions of reflection, antireflection, and polarizing coatings for converting the input beam (12) into two separated, parallel, orthogonally polarized beams (30, 31); a half-wave retardation plate (29) located in one of the separated beams (31) for converting the two separated, parallel, orthogonally polarized beams (30, 31); into first and second beams which are spatially separated parallel, and have the same polarization (30, 33); a polarizing beamsplitter (40) and quarter-wave retardation plate (44) for transmitting the first and second beams (34, 35) to a fixed plano mirror (70) nominally perpendicular to the first and second beams for reflecting the first and second beams back into the quarter-wave retardation plate (44), polarizing beams

Abstract: The invention provides a method and apparatus for focusing and imaging x-rays. An opaque sphere is used as a diffractive imaging element to diffract x-rays from an object so that the divergent x-ray wavefronts are transformed into convergent wavefronts and are brought to focus to form an image of the object with a large depth of field.

Abstract: A system for generating a spatially stable, small diameter light beam (18) which serves as a straight reference line over long distances may use the direction of propagation of light and one fixed point (11, 12) or may be between two fixed points (12, 21). In either instance, a light source (1) emits a beam (2) which is expanded, collimated and spatially filtered (3, 4). In the first instance, the collimated light wave (11) produced is diffracted by a sphere (12) to produce the small diameter light beam (18) which is constituted by a continuum of spots (16) which, in turn, produces a Poisson's spot (16) on a detector (21) which spatially samples the intensity of the spot (16). The resultant voltage (22) from each active detection are sent to a center locating electronics/computer (24) which processes the voltages (22) to give the position of the detector (21) relative to the straight reference line (18).

Abstract: A differential plane mirror interferometer system comprises a laser source (10) which emits an input beam (12) having two linear orthogonally polarized components, which may or may not be of the same optical frequency. A birefringent optical element (64) converts the input beam components (20,21) into two separated, parallel, orthogonally polarized beams (22,23). The birefringent element (64) together with a first quarter-wave phase retardation plate (66), a second quarter-wave phase retardation plate (62) with a pair of holes, and a retroreflector (60) with a pair of holes aligned with the holes in the second quarter-wave phase retardation plate (62), causes each of the separated, parallel, orthogonally polarized beams to be reflected twice by one of two plane mirrors (68,70), namely a first plane mirror (68) or a second plane mirror (70), respectively, to produce two separated, parallel, orthogonally polarized output beams (54, 55).

Abstract: A single interferomter system capable of measuring accurately linear displacement and angular displacement simultaneously of a movable plane mirror (90) comprises a source (10) of a frequency stabilized input beam (12), a polarization beamsplitter (80), two quarter-wave plates (88, 108), a mirror (89), and a retroreflector (81), to reflect one polarization component of the input beam (12) twice from the movable mirror (90) to produce a first output beam and to reflect the other polarization component of the input beam (12) twice from the stationary mirror (89) to produce a second output beam. The beamsplitter (80) recombines the output beams into a third output beam having two orthogonally polarized components related to the linear displacement of the movable mirror (90) at the first position.

Abstract: A single interferometer system (20) which simultaneously measures linear and angular displacement of a movable plane mirror (90) employs a frequency stabilized laser (10) which emits an input beam (12) comprised of two linear orthogonally polarized components which may or may not be of the same optical frequency. The input beam (12) is incident on a beamsplitter (14) which transmits a beam (16) and reflects a beam (15), with the reflected beam (15) being reflected off a mirror (18) to form a beam (17) which is parallel to but spatially offset from beam (16). Beams (16) and (17) are incident on interferometer (20) and are used to measure linear and angular displacement, respectively, using a polarization beamsplitter (80), prism (82), retroreflector (81) and quarter phase retardation plate (88).

Abstract: An angular displacement interferometer system capable of measuring accurately changes in angular displacement comprises a source (10) of a frequency stabilized input beam with two linear orthogonally polarized components; a tilted parallel plate or shear place (16) with regions of reflection, antireflection, and polarizing coatings for converting the input beam (12) into two separated, parallel, orthogonally polarized beams (30, 31); a half-wave retardation plate (29) located in one of the separated beams (31) for converting the two separated, parallel, orthogonally polarized beams (30, 31); into first and second beams which are spatially separated parallel, and have the same polarization (30, 33); a polarizing beamsplitter (40) and quarter-wave retardation plate (44) for transmitting the first and second beams (34, 35) to a fixed plano mirror (70) nominally perpendicular to the first and second beams for reflecting the first and second beams back into the quarter-wave retardation plate (44), polarizing beams