Patents by Inventor Gary G. Wagner

Gary G. Wagner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Microfinish measurement apparatus and technique
    Patent number: 4476489
    Abstract: An apparatus and technique for measuring microfinishes of workpieces at on-line speeds. A digitized image of a finished surface of a workpiece is generated. Under microprocessor control, a distribution of the digitized values is obtained. This distribution is compared against pre-stored distributions of known surface finishes to determine the type of finish of the workpiece and/or the acceptability of the finish. The comparison is obtained using curve matching techniques and by comparison of mean gray level values.
    Type: Grant
    Filed: May 20, 1982
    Date of Patent: October 9, 1984
    Assignee: Inspection Technology, Inc.
    Inventors: Gary P. Weltlich, Gary G. Wagner