Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Abstract: A lock-aid circuit and method is applied to a phase lock loop (PLL) having a voltage controlled oscillator (VCO), wherein the lock aid is coupled with the input of the VCO. In one example, the lock aid includes a Schmitt trigger having an output, a switch having an output and an input coupled to the output of the Schmitt trigger, and a voltage controlled current source coupled with the output of the switch.

Abstract: A method is provided for forming thin polysilicon transistor gates using dual doped polysilicon without reducing the ion implant energy. The method comprises depositing polysilicon over a region of a substrate, masking and implanting the polysilicon with dopant impurities to form the channel regions of one conductivity type, and removing the photo resist mask. The polysilicon layer is then masked to define the channel regions of the opposite conductivity type and is implanted with dopant impurities of the opposite conductivity type. Following the dual ion implantation, the photo resist mask is removed and the substrate may be annealed to activate the dopants in the polysilicon. The dual doped polysilicon layer is then polished using a chemical-mechanical polish to achieve a desired thickness for the polysilicon transistor gates. The polysilicon is subsequently masked and etched to define the polysilicon transistor gates.