Patents by Inventor Gary Hieftje

Gary Hieftje has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090121151
    Abstract: A charged particle detector and method are disclosed providing for simultaneous detection and measurement of charged particles at one or more levels of particle flux in a measurement cycle. The detector provides multiple and independently selectable levels of integration and/or gain in a fully addressable readout manner.
    Type: Application
    Filed: January 21, 2009
    Publication date: May 14, 2009
    Inventors: M. Bonner Denton, Roger Sperline, David W. Koppenaal, Charles J. Barinaga, Gary Hieftje, James H. Barnes, IV, Eugene Atlas
  • Patent number: 7498585
    Abstract: A charged particle detector and method are disclosed providing for simultaneous detection and measurement of charged particles at one or more levels of particle flux in a measurement cycle. The detector provides multiple and independently selectable levels of integration and/or gain in a fully addressable readout manner.
    Type: Grant
    Filed: April 6, 2006
    Date of Patent: March 3, 2009
    Assignee: Battelle Memorial Institute
    Inventors: M. Bonner Denton, Roger Sperline, David W. Koppenaal, Charles J. Barinaga, Gary Hieftje, James H. Barnes, IV, Eugene Atlas
  • Publication number: 20080073548
    Abstract: A charged particle detector and method are disclosed providing for simultaneous detection and measurement of charged particles at one or more levels of particle flux in a measurement cycle. The detector provides multiple and independently selectable levels of integration and/or gain in a fully addressable readout manner.
    Type: Application
    Filed: April 6, 2006
    Publication date: March 27, 2008
    Applicant: Battelle Memorial Institute,
    Inventors: M. Bonner Denton, Roger Sperline, David W. Koppenaal, Charles J. Barinaga, Gary Hieftje, James H. Barnes, Eugene Atlas
  • Publication number: 20050035283
    Abstract: A method and apparatus for operating a mass spectrometer include providing at least two different ion sources, and coupling ion streams simultaneously from the at least two different ion sources to the spectrometer. Another method of operating a spectrometer includes a first coupling an ion stream from a first one of the ion sources into the spectrometer, next coupling an ion stream from a second one of the ion sources into the spectrometer, next coupling an ion stream from the second one of the ion sources into the spectrometer, and next coupling an ion stream from the first one of the ion sources into the spectrometer.
    Type: Application
    Filed: January 2, 2003
    Publication date: February 17, 2005
    Inventors: Gary Hieftje, Steven Ray