Abstract: Apparatuses, systems, and methods are disclosed for managing configuration parameters for non-volatile data storage. A control module is configured to limit erase dwell times for blocks of a non-volatile memory medium to satisfy a threshold. A block classification module is configured to group blocks of a non-volatile memory medium based on retention times for the blocks. A block access module is configured to access at least one group of blocks using a read voltage threshold selected based on a grouping.

Abstract: Storage divisions of a non-volatile storage medium may have a writable state and an unwritable state. Storage divisions may be reclaimed by, inter alia, resetting the storage division from an unwritable state to a writable state. Writable storage divisions may be used to service incoming storage requests. If no writable storage divisions are available, requests may stall. One or more storage divisions may be held in a writable state to avoid stall conditions. This, however, may increase the erase dwell time of the storage divisions, which can result in increased wear and reduce the usable life of the storage device. Storage divisions may be prepared for use such that the storage divisions are transitioned to a writable state such that erase dwell time of the storage divisions is reduced, and the storage divisions are available as needed to service incoming requests.

Abstract: The present invention for imaging sensor rejuvenation may include a rejuvenation illumination system configured to selectably illuminate a portion of an imaging sensor of an imaging system with illumination suitable for at least partially rejuvenating the imaging sensor degraded by exposure to at least one of extreme ultraviolet light or deep ultraviolet light; and a controller communicatively coupled to the rejuvenation illumination system and configured to direct the rejuvenation illumination system to illuminate the imaging sensor for one or more illumination cycles during a non-imaging state of the imaging sensor.

Abstract: Apparatuses, systems, and methods are disclosed for managing configuration parameters for non-volatile data storage. A control module is configured to limit erase dwell times for blocks of a non-volatile memory medium to satisfy a threshold. A block classification module is configured to group blocks of a non-volatile memory medium based on retention times for the blocks. A block access module is configured to access at least one group of blocks using a read voltage threshold selected based on a grouping.

Abstract: Apparatuses, systems, and methods are disclosed for managing configuration parameters for non-volatile data storage. A control module is configured to manage differences in one or more storage characteristics for blocks of a non-volatile memory medium within one or more established limits. A block classification module is configured to group blocks of a non-volatile memory medium based on one or more other storage characteristics. A configuration parameter module is configured to use a configuration parameter for at least one group of blocks based on a grouping. A configuration parameter update module is configured to update a configuration parameter for at least one group in response to a change in one or more managed storage characteristics.

Abstract: Storage divisions of a non-volatile storage medium may have a writable state and an unwritable state. Storage divisions may be reclaimed by, inter alia, resetting the storage division from an unwritable state to a writable state. Writable storage divisions may be used to service incoming storage requests. If no writable storage divisions are available, requests may stall. One or more storage divisions may be held in a writable state to avoid stall conditions. This, however, may increase the erase dwell time of the storage divisions, which can result in increased wear and reduce the usable life of the storage device. Storage divisions may be prepared for use such that the storage divisions are transitioned to a writable state such that erase dwell time of the storage divisions is reduced, and the storage divisions are available as needed to service incoming requests.

Abstract: Storage divisions of a non-volatile storage medium may have a writable state and an unwritable state. Storage divisions may be reclaimed by, inter alia, resetting the storage division from an unwritable state to a writable state. Writable storage divisions may be used to service incoming storage requests. If no writable storage divisions are available, requests may stall. One or more storage divisions may be held in a writable state to avoid stall conditions. This, however, may increase the erase dwell time of the storage divisions, which can result in increased wear and reduce the usable life of the storage device. Storage divisions may be prepared for use such that the storage divisions are transitioned to a writable state such that erase dwell time of the storage divisions is reduced, and the storage divisions are available as needed to service incoming requests.

Abstract: An inspection system with selectable apodization includes a selectably configurable apodization device disposed along an optical pathway of an optical system. The apodization device includes one or more apodization elements operatively coupled to one or more actuation stages. The one or more actuation stages are configured to selectably actuate the one or more apodization elements along one or more directions. The inspection system includes a control system communicatively coupled to the one or more actuation stages. The control system is configured to selectably control an actuation state of at the one or more apodization elements so as to apply a selected apodization profile formed with the one or more apodization elements.

Abstract: Storage divisions of a non-volatile storage medium may have a writable state and an unwritable state. Storage divisions may be reclaimed by, inter alia, resetting the storage division from an unwritable state to a writable state. Writable storage divisions may be used to service incoming storage requests. If no writable storage divisions are available, requests may stall. One or more storage divisions may be held in a writable state to avoid stall conditions. This, however, may increase the erase dwell time of the storage divisions, which can result in increased wear and reduce the usable life of the storage device. Storage divisions may be prepared for use such that the storage divisions are transitioned to a writable state such that erase dwell time of the storage divisions is reduced, and the storage divisions are available as needed to service incoming requests.

Abstract: Apparatuses, systems, and methods are disclosed for managing configuration parameters for non-volatile data storage. A control module is configured to manage differences in one or more storage characteristics for blocks of a non-volatile memory medium within one or more established limits. A block classification module is configured to group blocks of a non-volatile memory medium based on one or more other storage characteristics. A configuration parameter module is configured to use a configuration parameter for at least one group of blocks based on a grouping. A configuration parameter update module is configured to update a configuration parameter for at least one group in response to a change in one or more managed storage characteristics.

Abstract: An inspection system with selectable apodization includes a selectably configurable apodization device disposed along an optical pathway of an optical system. The apodization device includes one or more apodization elements operatively coupled to one or more actuation stages. The one or more actuation stages are configured to selectably actuate the one or more apodization elements along one or more directions. The inspection system includes a control system communicatively coupled to the one or more actuation stages. The control system is configured to selectably control an actuation state of at the one or more apodization elements so as to apply a selected apodization profile formed with the one or more apodization elements.

Abstract: An inspection system with selectable apodization includes an illumination source configured to illuminate a surface of a sample, a detector configured to detect at least a portion of light emanating from the surface of the sample, the illumination source and the detector being optically coupled via an optical pathway of an optical system, a selectably configurable apodization device disposed along the optical pathway, wherein the apodization device includes one or more apodization elements operatively coupled to one or more actuation stages configured to selectably actuate the one or more apodization elements along one or more directions, and a control system communicatively coupled to the one or more actuation and configured to selectably control apodization of illumination transmitted along the optical pathway by controlling an actuation state of the one or more apodization elements.

Abstract: Apparatuses, methods, and computer program products are disclosed for determining read thresholds for a non-volatile memory device. A method includes obtaining soft read data for a storage cell of a non-volatile storage medium. A method includes determining a read voltage threshold or other configuration parameter for a storage cell based on soft read data. A method includes using a determined read voltage threshold or other configuration parameter to read data from a storage cell.

Abstract: The present invention for imaging sensor rejuvenation may include a rejuvenation illumination system configured to selectably illuminate a portion of an imaging sensor of an imaging system with illumination suitable for at least partially rejuvenating the imaging sensor degraded by exposure to at least one of extreme ultraviolet light or deep ultraviolet light; and a controller communicatively coupled to the rejuvenation illumination system and configured to direct the rejuvenation illumination system to illuminate the imaging sensor for one or more illumination cycles during a non-imaging state of the imaging sensor.

Abstract: In a Czochralski process for growing single crystal silicon ingots, a system is provided for adding solid material to the liquid silicon during crystal growth for the purpose of directly controlling the latent heat of fusion with respect to a crystal melt interface. In contrast to the standard method for controlling power to the crucible heaters, the present system has been found to be much more effective for controlling melt temperature in the crucible, especially in heavily insulated systems. The system provides the advantages of reducing the electric power required to operate a Czochralski grower, while increasing the speed with which the melt temperature can be raised or lowered in a controlled manner.

Abstract: A weighing system is provided for a continuous Czochralski process that accurately measures the weight of the crucible and melt during crystal growth to control the introduction of feedstock in order to keep the weight approximately constant. The system can measure the weight of the crucible while the crucible is rotating, and is insensitive to vibrations of the melt surface as well as variable torques on the crucible shaft induced by the rotation. The system also measures the weight of the crucible and its contents in order to control the amount of feedstock recharged after an ingot is withdrawn.

Abstract: In a Czochralski process for growing single crystal silicon ingots, a system is provided for adding solid material to the liquid silicon during crystal growth for the purpose of directly controlling the latent heat of fusion with respect to a crystal melt interface. In contrast to the standard method for controlling power to the crucible heater, the present system has been found to be much more effective for controlling melt temperature in the crucible, especially in heavily insulated systems. The system provides the advantage of reducing the electric power required to operate a Czochralski grower, while increasing the speed with which the melt temperature can be raised or lowered in a controlled manner.

Abstract: Various systems for measurement of a specimen are provided. One system includes a first optical subsystem, which is disposed within a purged environment. The purged environment may be provided by a differential purging subsystem. The first optical subsystem performs measurements using vacuum ultraviolet light. This system also includes a second optical subsystem, which is disposed within a non-purged environment. The second optical subsystem performs measurements using non-vacuum ultraviolet light. Another system includes two or more optical subsystems configured to perform measurements of a specimen using vacuum ultraviolet light. The system also includes a purging subsystem configured to maintain a purged environment around the two or more optical subsystems. The purging subsystem is also configured to maintain the same level of purging in both optical subsystems.

Abstract: Various systems for measurement of a specimen are provided. One system includes an optical subsystem configured to perform measurements of a specimen using vacuum ultraviolet light and non-vacuum ultraviolet light. This system also includes a purging subsystem that is configured to maintain a purged environment around the optical subsystem during the measurements. Another system includes a cleaning subsystem configured to remove contaminants from a specimen prior to measurement. In one embodiment, the cleaning subsystem may be a laser-based cleaning subsystem that is configured to remove contaminants from a localized area on the specimen. The system also includes an optical subsystem that is configured to perform measurements of the specimen using vacuum ultraviolet light. The optical subsystem is disposed within a purged environment. In some embodiments, the system may include a differential purging subsystem that is configured to provide the purged environment for the optical subsystem.

Abstract: Various systems for measurement of a specimen are provided. One system includes a first optical subsystem, which is disposed within a purged environment. The purged environment may be provided by a differential purging subsystem. The first optical subsystem performs measurements using vacuum ultraviolet light. This system also includes a second optical subsystem, which is disposed within a non-purged environment. The second optical subsystem performs measurements using non-vacuum ultraviolet light. Another system includes two or more optical subsystems configured to perform measurements of a specimen using vacuum ultraviolet light. The system also includes a purging subsystem configured to maintain a purged environment around the two or more optical subsystems. The purging subsystem is also configured to maintain the same level of purging in both optical subsystems.