Abstract: Various defects in an electronic assembly can be intelligently identified with a system having at least a server connected to a first capture module and a second capture module. The first capture module may be positioned proximal a first manufacturing line while the second capture module is positioned proximal a second manufacturing line. Images can be collected of first and second electronic assemblies by respective first and second capture modules prior to the images being sent to a classification module of the server where at least one defect is automatically detected in each of the first and second electronic assemblies concurrently with the classification module.

Abstract: An apparatus and method for topographically characterizing a workpiece. The method includes scanning a first surface of a workpiece with a scanning probe at a first resolution to derive a first topographical image, and performing a refining operation on the first topographical image to obtain a true first topographical image. The method also includes scanning, with the scanning probe, a surface of interest of the workpiece, which is a sub-portion of the first surface, at a second resolution that is higher than the first resolution to derive a second topographical image. The second topographical image is scaled down to the first resolution. The method further includes performing a pattern recognition operation to substantially match the scaled-down second topographical image to a corresponding sub-portion of the true first topographical image. The matched sub-portion of the true first topographical image is employed to refine the second topographical image.

Abstract: Various defects in an electronic assembly can be intelligently identified with a system having at least a server connected to a first capture module and a second capture module. The first capture module may be positioned proximal a first manufacturing line while the second capture module is positioned proximal a second manufacturing line. Images can be collected of first and second electronic assemblies by respective first and second capture modules prior to the images being sent to a classification module of the server where at least one defect is automatically detected in each of the first and second electronic assemblies concurrently with the classification module.

Abstract: A slider that includes a leading edge surface; a trailing edge surface; and an air bearing surface (ABS) positioned between the leading edge surface and the trailing edge surface, wherein the trailing edge surface includes a read-write element, at least one low surface energy region and at least one high surface energy region.

Abstract: The invention relates to devices, compositions and methods used to improve vision and/or to treat an eye lens disease or condition. In some embodiments, the invention relates to altering or removing eye lens material for the treatment of presbyopia. In additional embodiments, the invention relates to placing compositions in a lens of an eye to improve elasticity of the lens both therapeutically by improving elasticity and/or improving refractive properties and/or prophylactically by preventing renewed stiffening and/or renewed deterioration of the lens refractive properties. In further embodiments, the invention relates to devices and methods of obtaining and analyzing data for use in altering the lens to optimize its elasticity and/or refractive properties.

Abstract: The invention relates to devices, compositions and methods used to improve vision and/or to treat an eye lens disease or condition. In some embodiments, the invention relates to altering or removing eye lens material for the treatment of presbyopia. In additional embodiments, the invention relates to placing compositions in a lens of an eye to improve elasticity of the lens both therapeutically by improving elasticity and/or improving refractive properties and/or prophylactically by preventing renewed stiffening and/or renewed deterioration of the lens refractive properties. In further embodiments, the invention relates to devices and methods of obtaining and analyzing data for use in altering the lens to optimize its elasticity and/or refractive properties.