Abstract: Light shaping apparatuses and methods and testing apparatuses are described. In one embodiment, a light shaping apparatus includes a diffuser to diffuse an intensity of a light passed through the diffuser, and an aperture forming layer having a first surface and a second surface and having an aperture formed therebetween wherein the first surface is adjacent to a surface of the diffuser, and wherein the aperture is oriented to direct the light from the diffuser toward a light receiving surface of an imaging device.

Abstract: A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.

Abstract: Stencils are provided for more precisely aligning stencil orifices with terminals or “targets” on a substrate. One such stencil is adapted for registration with an electronic substrate, such as a PCB, about a locus. The stencil includes a stencil body and an array of printing orifices passing through the stencil body. The printing orifices may have varying sizes, with the size of each printing orifice being a function of a distance of the printing orifice from the locus. Various methods are also provided, including methods for applying solder on electronic substrates using stencils and methods and systems for designing such stencils.

Abstract: Stencils are provided for more precisely aligning stencil orifices with terminals or “targets” on a substrate. One such stencil is adapted for registration with an electronic substrate, such as a PCB, about a locus. The stencil includes a stencil body and an array of printing orifices passing through the stencil body. The printing orifices may have varying sizes, with the size of each printing orifice being a function of a distance of the printing orifice from the locus. Various methods are also provided, including methods for applying solder on electronic substrates using stencils and methods and systems for designing such stencils.

Abstract: A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.

Abstract: A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.

Abstract: A reusable burn-in/test fixture for discrete die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.

Abstract: A signal timing analyzer monitors a programmable logic control (PLC) of an industrial machine. Signal states of the PLC are sampled and the signal information is then transferred to a receiver card which is connected to a computer data bus. This allows the computer to monitor a piece of equipment by "eavesdropping" on the industrial controller that is actually operating and monitoring the equipment. The analyzer uses an on-board clock and timing circuit, so that the computer is not limited by the computer's clock speed in controlling sampling rates.