Abstract: A method for forming a thermally stable ohmic contact structure that includes a region of monocrystalline semiconductor and a region of polycrystalline semiconductor. At least one region of dielectric material is formed between at least a portion of the region of monocrystalline semiconductor and the region of polycrystalline semiconductor, thereby controlling grain growth of the polycrystalline semiconductor.

Abstract: A method for forming a thermally stable ohmic contact structure that includes a region of monocrystalline semiconductor and a region of polycrystalline semiconductor. At least one region of dielectric material is formed between at least a portion of the region of monocrystalline semiconductor and the region of polycrystalline semiconductor, thereby controlling grain growth of the polycrystalline semiconductor.

Abstract: The present invention is directed to a method for forming a self-aligned epitaxial base transistor in a double polysilicon type process using non-selective low temperature epitaxy (LTE) to form the base layer. The present invention utilizes a thin very heavily doped LTE layer that is both a conductive etch stop and a diffusion source for doping the extrinsic base of the transistor. The deposition of the non-selective LTE base layer is followed immediately by the deposition of the conductive etch stop layer. A layer of undoped polycrystalline semiconductor is deposited on the conductive etch stop layer and subsequently ion implanted. Oxide and nitride insulating layers are deposited and the structure is patterned using a highly directional reactive ion etch to form the emitter window leaving a thin layer of the polycrystalline layer. The thin polycrystalline layer is selectively removed in a KOH solution leaving the conductive etch stop layer.

Abstract: A method for fabricating bipolar and CMOS devices in integrated circuits using W as a local interconnect and via landing pad for bipolar and CMOS devices. The method includes the forming of an oxide/silicon bilayer above a local interconnect of tungsten/titanium wherein the oxide is patterned as a mask for the silicon/tungsten/titanium reactive ion etch, and the silicon layer above the tungsten/titanium layer is used as an etch stop for a via etch. The silicon layer is then reacted and converted to titanium silicide after the via etch to provide a low resistance path in the via from the local interconnect in a self aligned manner.

Abstract: A complementary bipolar transistor structure having one symmetrical intrinsic region for both the NPN and PNP transistors and a method for fabricating the structure. The transistor structure includes a vertical NPN transistor operating in the upward direction and a vertical PNP transistor operating in a downward direction. In the method, the sub-emitter and the sub-collector regions are formed by depositing a first epitaxial layer of semiconductor material of a first conductivity type on the surface of a semiconductor substrate of a second conductivity type, and forming the sub-collector by etchig a shallow trench in the first layer and depositing semiconductor material of a second conductivity tyep by LTE and planarizing.

Abstract: A complementary bipolar transistor structure having one symmetrical intrinsic region for both the NPN and PNP transistors and a method for fabricating the structure. The transistor structure includes a vertical NPN transistor operating in the upward direction and a vertical PNP transistor operating in a downward direction. In the method, the sub-emitter and the sub-collector regions are formed by depositing a first epitaxial layer of semiconductor material of a first conductivity type on the surface of a semiconductor substrate of a second conductivity type, and forming the sub-collector by etching a shallow trench in the first layer and depositing semiconductor material of a second conductivity type by LTE and planarizing.