Abstract: A node includes a circuit board assembly having a circuit board and a processor mounted to the circuit board, the processor comprising a pin and an analog-to-digital converter (ADC) in electrical communication with the pin, the circuit board defining a test point formed therein, the test point electrically communicating with the pin via a trace covered with an insulator; and a non-transitory memory resource, the non-transitory memory resource having computer-executable instructions stored thereon that, when executed by the processor, cause the processor to apply electrical charge to the test point after the circuit board assembly has been encased in potting compound, and command the ADC to read a test point voltage at the test point, the test point voltage indicating voltage of an equivalent RC circuit comprising the insulator as an equivalent capacitor and the potting compound as an equivalent resistor.

Abstract: A node includes a circuit board assembly having a circuit board and a processor mounted to the circuit board, the processor comprising a pin and an analog-to-digital converter (ADC) in electrical communication with the pin, the circuit board defining a test point formed therein, the test point electrically communicating with the pin via a trace covered with an insulator; and a non-transitory memory resource, the non-transitory memory resource having computer-executable instructions stored thereon that, when executed by the processor, cause the processor to apply electrical charge to the test point after the circuit board assembly has been encased in potting compound, and command the ADC to read a test point voltage at the test point, the test point voltage indicating voltage of an equivalent RC circuit comprising the insulator as an equivalent capacitor and the potting compound as an equivalent resistor.