Abstract: An apparatus having a cache configured as N-way associative and a controller circuit is disclosed. The controller circuit may be configured to (i) detect one of a cache hit and a cache miss in response to each of a plurality of access requests to the cache, (ii) detect a collision among the access requests, (iii) queue at least two first requests of the access requests that establish a speculative collision, the speculative collision occurring where the first requests access a given congruence class in the cache and (iv) delay a line allocation to the cache caused by a cache miss of a given one of the first requests while the given congruence class has at least N outstanding line fills in progress.

Abstract: An apparatus having a cache configured as N-way associative and a controller circuit is disclosed. The controller circuit may be configured to (i) detect one of a cache hit and a cache miss in response to each of a plurality of access requests to the cache, (ii) detect a collision among the access requests, (iii) queue at least two first requests of the access requests that establish a speculative collision, the speculative collision occurring where the first requests access a given congruence class in the cache and (iv) delay a line allocation to the cache caused by a cache miss of a given one of the first requests while the given congruence class has at least N outstanding line fills in progress.

Abstract: A method for generalizing design attributes in a design capture environment comprising the steps of (A) defining a procedure for adding one or more auxiliary configurators to a tool or suite of tools, (B) linking the auxiliary configurators to predetermined object points in an abstracted design and (C) defining a procedure for the tool or suite of tools to reference the one or more auxiliary configurators, wherein the auxiliary configurators are neither referenced by a core nor built into the tool or suite of tools.

Abstract: A system for RTL test insertion in an integrated circuit layout pattern includes a core module, a test wrapper, and a smart wrapper. The core module describes a function defined by logical elements, interconnections between logical elements, input pins and output pins. The test wrapper is adapted to encapsulate the core module and to create test pins representing the core module. The smart wrapper is adapted to encapsulate the test wrapper and to assign the test pins to a non-asserted state. The smart wrapper is adapted to place an assertion on one or more of the test pins for static or dynamic testing of the integrated circuit layout pattern.

Abstract: A method for generalizing design attributes in a design capture environment comprising the steps of (A) defining a procedure for adding one or more auxiliary configurators to a tool or suite of tools, (B) linking the auxiliary configurators to predetermined object points in an abstracted design and (C) defining a procedure for the tool or suite of tools to reference the one or more auxiliary configurators, wherein the auxiliary configurators are neither referenced by a core nor built into the tool or suite of tools.

Abstract: A system for RTL test insertion in an integrated circuit layout pattern includes a core module, a test wrapper, and a smart wrapper. The core module describes a function defined by logical elements, interconnections between logical elements, input pins and output pins. The test wrapper is adapted to encapsulate the core module and to create test pins representing the core module. The smart wrapper is adapted to encapsulate the test wrapper and to assign the test pins to a non-asserted state. The smart wrapper is adapted to place an assertion on one or more of the test pins for static or dynamic testing of the integrated circuit layout pattern.

Abstract: A delay line calibration circuit and method are provided in which a programmable master delay line drives a delay clock and has a propagation delay that is a function of a delay setting. A delay counter is clocked by the delay clock and has a delay count. A reference counter is clocked by a reference clock and has a reference count. A control circuit controls the delay and reference counters, compares a representation of the delay count to a representation of the reference count and responsively generates a modified value for the delay setting to reduce a difference between the representations of delay count and the reference count.