Patents by Inventor Gary Neil Burk

Gary Neil Burk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Simulated calibration sample for a spectrographic measurement sensor and method for use
    Patent number: 7068366
    Abstract: A simulated calibration and verification reference sample for a measurement system including a blackbody radiation source and a spectrographic sensor is disclosed. By providing a simulating reference sample, no actual sample is required and the problems associated with an actual sample including preparation, maintenance, use, storage, replacement and the like are eliminated.
    Type: Grant
    Filed: October 31, 2003
    Date of Patent: June 27, 2006
    Assignee: ABB Inc.
    Inventor: Gary Neil Burk
  • Infrared measuring apparatus and method for on-line application in manufacturing processes
    Patent number: 6960769
    Abstract: A single vane shutter flag is asynchronously controlled so that a measuring system light source is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors. Source/detector hemispheres or serially connected randomly oriented fiber bundles homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
    Type: Grant
    Filed: October 3, 2002
    Date of Patent: November 1, 2005
    Assignee: ABB Inc.
    Inventors: Gary Neil Burk, Thomas Michael Domin, Rodney Dale Maxson, Dennis Charles Daugherty, Steven Perry Sturm
  • Infrared measuring apparatus and method for on-line application in manufacturing processes
    Publication number: 20040065829
    Abstract: A single vane shutter flag is asynchronously controlled so that a measuring system light source is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors. Source/detector hemispheres or serially connected randomly oriented fiber bundles homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
    Type: Application
    Filed: October 3, 2002
    Publication date: April 8, 2004
    Inventors: Gary Neil Burk, Thomas Michael Domin, Rodney Dale Maxson, Dennis Charles Daugherty, Steven Perry Sturm