Abstract: The present invention, in one form, is a system which, in one embodiment, varies DAS gain to better accommodate different scanning parameters between different scans, even at the same slice thickness. Specifically, in one embodiment, the DAS gain is varied, or modulated, as a function of slice thickness, x-ray tube current and voltage levels, scan time, and average detector gain. The DAS gain is modulated using a gain factor Gain.sub.-- Fac which is determined in accordance with each of the above-mentioned scanning parameters. The gain factor Gain.sub.-- Fac is then used to determine an appropriate DAS gain for such parameters. Particularly, DAS gains are stored in a look-up table in the CT system computer, and the gain factor Gain.sub.-- Fac is used to select the appropriate DAS gain from the look-up table. The determined DAS gain is then utilized to correct data acquired during a scan.