Abstract: Apparatus and test film strip for evaluation of a film processor, particularly an x-ray film processor, based on a photodetector signal sequentially indicating the optical density of graded density test areas on a developed film and comparing the output thereof to a preselected voltage relating to the acceptable/too dark threshold of an unexposed or base fog area, the acceptable or too light threshold of a maximum density or dark area and the acceptable/too light and acceptable/too dark threshold of a medium density test area. Sequence testing of the graded density areas is functionally related on a single film strip to timing marks, adapted to be read by photodetector and timing circuitry, the timing marks and graded density test areas being linearly spaced and relatively disposed along the length of film strip.

Abstract: Apparatus and method for evaluation of a film processor, particularly an x-ray film processor, based on a photodetector signal sequentially indicating the optical density of graded density test areas on a developed film and comparing the output thereof to a preselected voltage relating to the acceptable/too dark threshold of an unexposed or base fog area, the acceptable or too light threshold of a maximum density or dark area and the acceptable/too light and acceptable/too dark threshold of a medium density test area. Sequence testing of the graded density areas is functionally related on a single film strip to timing marks, adapted to be read by photodetector and timing circuitry, the timing marks and graded density test areas being linearly spaced and relatively disposed along the length of film strip.

Abstract: A method and apparatus for determining the operational status of a photographic film processor, particularly an X-ray film processor. A photographic film is exposed to a test pattern including at least three areas to produce, upon development of said test film, a light (medium density) area, a dark (high density) area and an unexposed (base fog) area. The test film is then developed, and densitometer readings made of the resultant film densities in the test areas. These densitometer readings are used as inputs to digital logic circuitry to produce a series of diagnostic indications of the processor's operational status.