Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.

Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.

Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.

Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.

Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.

Abstract: Some embodiments of the present disclosure relate to a processing tool. The tool includes a housing enclosing a processing chamber, and an input/output port configured to pass a wafer through the housing into and out of the processing chamber. A back-side macro-inspection system is arranged within the processing chamber and is configured to image a back side of the wafer. A front-side macro-inspection system is arranged within the processing chamber and is configured to image a front side of the wafer according to a first image resolution. A front-side micro-inspection system is arranged within the processing chamber and is configured to image the front side of the wafer according to a second image resolution which is higher than the first image resolution.

Abstract: A demand response determination apparatus and a demand response determination method thereof are provided. The demand response determination apparatus connects to an electric power system via a network. The demand response determination apparatus receives power consumption information from the electric power system and decides a power consumption mode of the electric power system according to the power consumption information. The demand response determination apparatus calculates demanded power according to the power consumption mode and determines whether the demanded power exceeds a power consumption threshold. The demand response determination apparatus informs the electric power system to unload electric power equipment when the demanded power exceeds the power consumption threshold.

Abstract: A demand response determination apparatus and a demand response determination method thereof are provided. The demand response determination apparatus connects to an electric power system via a network. The demand response determination apparatus receives power consumption information from the electric power system and decides a power consumption mode of the electric power system according to the power consumption information. The demand response determination apparatus calculates demanded power according to the power consumption mode and determines whether the demanded power exceeds a power consumption threshold. The demand response determination apparatus informs the electric power system to unload electric power equipment when the demanded power exceeds the power consumption threshold.

Abstract: A data collection system is formed from an analyte detection meter and a base station. The meter and the base station are operatively connected to one another to transfer data from the meter. The base station is able to communicate transferred data to a data receiving server, and the transfer of data occurs in response to a defined stimulus such as the proximity of the meter and base station or an alarm set at a predetermined time of day. The data collection system can be used in combination with a system interface that provides a data management system (DMS) resident on a device such as a personal computer. The DMS can recognize a particular meter and may incorporate into the displayed information not only the data resident on the meter but also information previously transferred from the meter. The DMS may be launched on the computer as soon as connection with a meter is detected.

Abstract: A data collection system is formed from an analyte detection meter and a base station. The meter and the base station are operatively connected to one another to transfer data from the meter. The base station is able to communicate transferred data to a data receiving server, and the transfer of data occurs in response to a defined stimulus such as the proximity of the meter and base station or an alarm set at a predetermined time of day. The data collection system can be used in combination with a system interface that provides a data management system (DMS) resident on a device such as a personal computer. The DMS can recognize a particular meter and may incorporate into the displayed information not only the data resident on the meter but also information previously transferred from the meter. The DMS may be launched on the computer as soon as connection with a meter is detected.

Abstract: A liquid crystal display driver has N common drive lines and M segment drive lines. A liquid crystal display has M segment driver leads and N times P common drive leads, P being at least two. P multiplexers are provided, each external to the liquid crystal display driver. Each of the M segment driver lines is connected with a respective one of the M segment drive leads. Each multiplexer comprising N switches, each switch defining a normally-open contact, a normally-closed contact, and a common contact. Each of the switches is connected by its common contact with a respective one of the common drive leads of the liquid crystal display. Each of the switches is connected by its normally-closed contact with a cancel signal. The N switches of each multiplexer are each connected with a respective one of the N common drive lines of the liquid crystal display driver.

Abstract: Abstract of the Disclosure A test meter has a display, and has a test strip containing an electrochemical cell disposed to analyze a bodily fluid for a property of interest. While the analysis is in progress, the display is changed no less often than once per half second.