Patents by Inventor Gautier CAPUT

Gautier CAPUT has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for detecting a defect on a surface by multidirectional lighting and associated device
    Patent number: 10648920
    Abstract: A method for detecting a defect on a surface (12) by multidirectional lighting includes acquiring a plurality of images of the surface (12) using an optical device (14) having an optical axis, each image being acquired with a lighting of the surface along a lighting direction (E, E?) given for each point of the surface (12) and an optical direction (O), the images being acquired with different lighting directions (E, E?) or different combinations and/or with different optical directions (O); for each point, calculating a plurality of parameters, the parameters including coefficients of an equation characterizing the response of said point of the surface as a function of the lighting direction (E, E?) and an observation direction (B, B?); and deducing from the calculated parameters whether the surface (12) has a defect at said point.
    Type: Grant
    Filed: April 5, 2017
    Date of Patent: May 12, 2020
    Assignee: Framatome
    Inventors: Matthieu Taglione, Clément Skopinski, Gautier Caput
  • Method for Detecting a Defect on a Surface by Multidirectional Lighting and Associated Device
    Publication number: 20190162674
    Abstract: A method for detecting a defect on a surface (12) by multidirectional lighting includes acquiring a plurality of images of the surface (12) using an optical device (14) having an optical axis, each image being acquired with a lighting of the surface along a lighting direction (E, E?) given for each point of the surface (12) and an optical direction (O), the images being acquired with different lighting directions (E, E?) or different combinations and/or with different optical directions (O); for each point, calculating a plurality of parameters, the parameters including coefficients of an equation characterizing the response of said point of the surface as a function of the lighting direction (E, E?) and an observation direction (B, B?); and deducing from the calculated parameters whether the surface (12) has a defect at said point.
    Type: Application
    Filed: April 5, 2017
    Publication date: May 30, 2019
    Inventors: Matthieu TAGLIONE, Clément SKOPINSKI, Gautier CAPUT