Patents by Inventor Gavi E. Begtrup

Gavi E. Begtrup has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method to determine thermal profiles of nanoscale circuitry
    Patent number: 8433536
    Abstract: A platform that can measure the thermal profiles of devices with nanoscale resolution has been developed. The system measures the local temperature by using an array of nanoscale thermometers. This process can be observed in real time using a high resolution imagining technique such as electron microscopy. The platform can operate at extremely high temperatures.
    Type: Grant
    Filed: February 14, 2008
    Date of Patent: April 30, 2013
    Assignee: The Regents of the University of California
    Inventors: Alexander K. Zettl, Gavi E. Begtrup
  • METHOD TO DETERMINE THERMAL PROFILES OF NANOSCALE CIRCUITRY
    Publication number: 20100204951
    Abstract: A platform that can measure the thermal profiles of devices with nanoscale resolution has been developed. The system measures the local temperature by using an array of nanoscale thermometers. This process can be observed in real time using a high resolution imagining technique such as electron microscopy. The platform can operate at extremely high temperatures.
    Type: Application
    Filed: February 14, 2008
    Publication date: August 12, 2010
    Inventors: Alexander K. Zettl, Gavi E. Begtrup