Patents by Inventor Gavin Hanson

Gavin Hanson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10614567
    Abstract: Methods and apparatus quantify mass effect deformation in diagnostic images of patients demonstrating glioblastoma multiforme (GBM). One example apparatus includes an image acquisition circuit that acquires an image of a region of tissue demonstrating GBM pathology, a delineation circuit that segments a tumor region from the image, a pre-processing circuit that generates a pre-processed image by pre-processing the segmented image, a registration circuit that registers the pre-processed image with a template image of a healthy brain, a deformation quantification circuit that computes a set of differences between a position of a brain sub-structure represented in the registered image relative to the position of the brain sub-structure represented in the template image. Embodiments may include a classification circuit that classifies the region of tissue as a long or short-term survivor based, at least in part, on the set of differences.
    Type: Grant
    Filed: January 4, 2017
    Date of Patent: April 7, 2020
    Assignee: Case Western Reserve University
    Inventors: Pallavi Tiwari, Anant Madabhushi, Gavin Hanson, Jhimli Mitra
  • Publication number: 20180025489
    Abstract: Methods and apparatus quantify mass effect deformation in diagnostic images of patients demonstrating glioblastoma multiforme (GBM). One example apparatus includes an image acquisition circuit that acquires an image of a region of tissue demonstrating GBM pathology, a delineation circuit that segments a tumor region from the image, a pre-processing circuit that generates a pre-processed image by pre-processing the segmented image, a registration circuit that registers the pre-processed image with a template image of a healthy brain, a deformation quantification circuit that computes a set of differences between a position of a brain sub-structure represented in the registered image relative to the position of the brain sub-structure represented in the template image. Embodiments may include a classification circuit that classifies the region of tissue as a long or short-term survivor based, at least in part, on the set of differences.
    Type: Application
    Filed: January 4, 2017
    Publication date: January 25, 2018
    Inventors: Pallavi Tiwari, Anant Madabhushi, Gavin Hanson, Jhimli Mitra