Patents by Inventor Gavril Bende

Gavril Bende has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probes for probe cards used for testing semiconductor devices, manufacturing method and positioning method
    Publication number: 20030001606
    Abstract: There is disclosed a test apparatus with probes for checking the proper working of semiconductor devices (111) immediately after their manufacture. More precisely, such systems are provided with particular probes (1), in that they include at least two tips (8, 9, 18, 29) at their end, which enters into contact with the contact bumps (2) of said semiconductor devices during the test phases. In this way, tolerances existing on the deformations undergone by said probes during tests are greater than those of probes of the prior art.
    Type: Application
    Filed: June 27, 2002
    Publication date: January 2, 2003
    Applicant: EM MICROELECTRONIC-MARIN SA
    Inventors: Gavril Bende, Francisco Ramos