Patents by Inventor Geert J. Wijntjes

Geert J. Wijntjes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Meterology using interferometric measurement technology for measuring scale displacement with three output signals
    Patent number: 5098190
    Abstract: A metrology system includes means for generating an interference fringe pattern as a function of a parameter to be measured, transducer apparatus for simultaneously generating three intensity-modulated optical signals, I.sub.R, I.sub.S and I.sub.T, that are related to the interference fringe pattern; signal processing apparatus for accurately determining an aspect of the interference fringe pattern from the three signals; means for accumulating phase information proportional to the aspect of the interference fringe pattern; and means for converting the accumulated phase and aspect information to desired outputs indicative of the parameter to be measured.
    Type: Grant
    Filed: August 7, 1989
    Date of Patent: March 24, 1992
    Assignee: Optra, Inc.
    Inventors: Geert J. Wijntjes, Michael Hercher