Patents by Inventor Geert J. Wyntjes

Geert J. Wyntjes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Portable extended life metrology system for measuring scale displacement with three output signals using a pulsed source
    Patent number: 5317385
    Abstract: A portable extended life metrology system is disclosed. The system is of the kind which includes means for generating an interference fringe pattern as a function of a parameter to be measured, transducer apparatus for simultaneously generating three intensity-modulated optical signals, I.sub.R, I.sub.S and I.sub.T that are related to the interference fringe pattern; signal processing apparatus for accurately determining an aspect of the interference fringe pattern form the three signals; means for accumulating phase information proportional to the aspect of the interference fringe pattern; and means for converting the accumulated phase and aspect information to desired outputs indicative of the parameter to be measured.
    Type: Grant
    Filed: December 16, 1992
    Date of Patent: May 31, 1994
    Assignee: Federal Products Corporation
    Inventors: John R. Silva, Geert J. Wyntjes