Patents by Inventor GEETA

GEETA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuit for detecting damage to a peripheral edge on an integrated circuit die
    Patent number: 11454669
    Abstract: An integrated circuit die has a peripheral edge and a seal ring extending along the peripheral edge and surrounding a functional integrated circuit area. A test logic circuit located within the functional integrated circuit area generates a serial input data signal for application to a first end of a sensing conductive wire line extending around the seal ring between the seal ring and the peripheral edge of the integrated circuit die. Propagation of the serial input data signal along the sensing conductive wire line produces a serial output data signal at a second end of the sensing conductive wire line. The test logic circuit compares data patterns of the serial input data signal and serial output data signal to detect damage at the peripheral edge of the integrated circuit die.
    Type: Grant
    Filed: November 11, 2019
    Date of Patent: September 27, 2022
    Assignees: STMicroelectronics International N.V., STMicroelectronics (Crolles 2) SAS, STMicroelectronics (Grenoble 2) SAS
    Inventors: Manoj Kumar, Lionel Courau, Geeta, Olivier Le-Briz
  • CIRCUIT FOR DETECTING DAMAGE TO A PERIPHERAL EDGE ON AN INTEGRATED CIRCUIT DIE
    Publication number: 20200150174
    Abstract: An integrated circuit die has a peripheral edge and a seal ring extending along the peripheral edge and surrounding a functional integrated circuit area. A test logic circuit located within the functional integrated circuit area generates a serial input data signal for application to a first end of a sensing conductive wire line extending around the seal ring between the seal ring and the peripheral edge of the integrated circuit die. Propagation of the serial input data signal along the sensing conductive wire line produces a serial output data signal at a second end of the sensing conductive wire line. The test logic circuit compares data patterns of the serial input data signal and serial output data signal to detect damage at the peripheral edge of the integrated circuit die.
    Type: Application
    Filed: November 11, 2019
    Publication date: May 14, 2020
    Applicants: STMicroelectronics International N.V., STMicroelectronics (Crolles 2) SAS, STMicroelectronics (Grenoble 2) SAS
    Inventors: Manoj KUMAR, Lionel COURAU, GEETA, Olivier LE-BRIZ