Abstract: An apparatus for a volatile latch circuit. The volatile latch circuit may have a master latch sub circuit coupled to a slave latch sub circuit. The slave latch sub circuit maintains the logic state stored by the volatile latch circuit. The slave sub circuit may connect to a first power trace that continuously provides a first voltage potential to the slave latch sub circuit even during a sleep mode. The master latch sub circuit may connect to a second power trace that provides a second voltage potential to the master latch sub circuit that is switchably turned off during the sleep mode.

Abstract: Various methods and apparatuses are described in which a volatile latch circuit. The volatile latch circuit may have a master latch sub circuit coupled to a slave latch sub circuit. The slave latch sub circuit maintains the logic state stored by the volatile latch circuit. The slave sub circuit may connect to a first power trace that continuously provides a first voltage potential to the slave latch sub circuit even during a sleep mode. The master latch sub circuit may connect to a second power trace that provides a second voltage potential to the master latch sub circuit that is switchably turned off during the sleep mode.

Abstract: A Programmable Read Only Memory (PROM) and an on-chip programmability verification circuit is provided that allows for the verification of the programmability of lateral fuses. The PROM comprises a plurality of word lines, a plurality of bit lines, and a plurality of fuses, wherein each of the fuses are uniquely coupled between one of the word lines and one of the bit lines. A sense amplifier is coupled between each of the word lines and an output terminal. One each of a plurality of variable voltage current sources having a test voltage applied thereto is coupled to one of the sense amplifiers for providing a current to the sense amplifier, and in turn to the word line and fuse, wherein the resistance of the fuse in relation to a nominal value may be determined by comparing the test voltage and an output voltage on the output terminal.

Abstract: A ROM having an on-chip current switch is provided that removes the programming voltage from the vertical fuse of the ROM when the fuse is programmed, thereby preventing excessive current from flowing therethrough. A programming current switch is coupled between an output terminal and a row decode for switchable transmitting a programming voltage from the output terminal to the row decode, a word line and a fuse, wherein the programming voltage will program the fuse causing the voltage thereacross to change. A program sense amplifier is coupled between the row decode and the programming current switch for switching the programming current switch off when the voltage change has been sensed.