Abstract: A switching activity report of simulated switching activities of a semiconductor circuit is accessed. A plurality of glitch bottleneck ratios corresponding to a plurality of pins in the semiconductor circuit are determined, comprising by: setting an initial bottleneck ratio on a leaf output pin; and backward traversing the semiconductor circuit to determine a plurality of glitch bottleneck ratios of pins in a fan-in cone of the leaf output pin. A plurality of total glitch powers associated with the plurality of pins is determined, a total glitch power of the plurality of total glitch powers being determined based on a glitch bottleneck ratio and a glitch power of a corresponding pin. One or more critical bottleneck pins among the plurality of pins are identified based on the plurality of total glitch powers. One or more gates associated with the one or more critical bottleneck pins are adjusted to reduce corresponding one or more total glitch powers of the one or more gates.

Abstract: A signoff process includes: accessing circuit information of a circuit; performing, using an analysis and optimization engine, power analysis and optimization on the circuit to generate an optimized circuit, the power analysis and optimization being performed using an input pattern; performing, using a simulator, a simulation on at least a portion of an optimized circuit, the simulation being performed using the input pattern used in the power analysis and optimization; and outputting a simulation result to the analysis and optimization engine; wherein the analysis and optimization engine and the simulator are integrated.

Abstract: A signoff process includes: accessing circuit information of a circuit; performing, using an analysis and optimization engine, power analysis and optimization on the circuit to generate an optimized circuit, the power analysis and optimization being performed using an input pattern; performing, using a simulator, a simulation on at least a portion of an optimized circuit, the simulation being performed using the same input pattern; and outputting a simulation result to the analysis and optimization engine; wherein the analysis and optimization engine and the simulator are integrated.

Abstract: A switching activity report of simulated switching activities of a semiconductor circuit is accessed. A plurality of glitch bottleneck ratios corresponding to a plurality of pins in the semiconductor circuit are determined, comprising by: setting an initial bottleneck ratio on a leaf output pin; and backward traversing the semiconductor circuit to determine a plurality of glitch bottleneck ratios of pins in a fan-in cone of the leaf output pin. A plurality of total glitch powers associated with the plurality of pins is determined, a total glitch power of the plurality of total glitch powers being determined based on a glitch bottleneck ratio and a glitch power of a corresponding pin. One or more critical bottleneck pins among the plurality of pins are identified based on the plurality of total glitch powers. One or more gates associated with the one or more critical bottleneck pins are adjusted to reduce corresponding one or more total glitch powers of the one or more gates.

Abstract: The present invention discloses a method and system for viewing simulation signals of a digital product. When a controller controls a FPGA to perform a first simulation verification, the controller reads and records status data of all external ports of the digital product in real time, and reads and records all internal status data of the digital product once at each interval. After the FPGA simulation is completed, if data of a certain clock cycle of the digital product needs to be viewed in a backtracking manner, the controller loads the digital product into the software simulator to perform a second simulation verification, and sets the external port status data and the internal status data recorded at said last time point as an initial status of the digital product. By adopting the technical solution, all simulated data of any clock cycle can be viewed quickly in a backtracking manner.

Abstract: A set of multi-corner multimode (MCMM) databases that correspond to a set of working scenarios are accessed. A full timing update on the set of MCMM databases, for the set of working scenarios, is applied. A graph based analysis (GBA) timing calibration is performed on the databases, for the set of working scenarios to obtain a set of GBA-calibrated databases. Multiphase optimizations on the set of GBA-calibrated databases are iteratively performed to generate a set of optimized databases, including: performing a phase-specific optimization on the set of GBA-calibrated database to obtain an improved set of databases, and recalibrating GBA timing on the set of improved databases prior to a next phase-specific optimization.

Abstract: A graph-based analysis (GBA) output is obtained comprising timing information pertaining to a plurality of paths in an integrated circuit. A path-based analysis (PBA) is performed on the GBA output to analyze timing of the plurality of paths and generate a set of improved timing results; wherein the physical measurements used by the PBA are more accurate than the physical measurements used by the GBA. The PBA result is output to an optimizer to automatically adjust the circuit.

Abstract: A database is constructed based on a batch PBA performed on a plurality of paths of an integrated circuit. A local PBA is performed on a portion of a selected path. A selected optimization move is identified on the portion of the selected path, based on a result of the local PBA that best meets a set of constraints. A path-wide PBA is performed for an updated path that is based on the selected path incorporating the selected optimization move. The selected optimization move is committed in a netlist associated with the integrated circuit.

Abstract: A plurality of multi-corner multimode (MCMM) databases are accessed, wherein at least one of the plurality of MCMM databases corresponds to a first optimization scenario, and at least one of the plurality of MCMM databases corresponds to a second optimization scenario. A first optimization move is performed on paths in the first optimization scenario. The first optimization move is verified using GBA on paths in the second optimization scenario to determine that the first optimization move does not cause timing violations outside an MCMM database associated with the first optimization scenario.

Abstract: Modifying a circuit includes: obtaining timing information of the circuit, wherein the timing information includes timing information pertaining to a critical path of the circuit; determining a scope associated with the critical path, the scope including a subset of the circuit; and performing a fix based at least in part on physical information associated with the circuit to improve timing of the scope.