Patents by Inventor Geng Lu

Geng Lu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of optimizing wavelength calibration
    Patent number: 6700661
    Abstract: The present invention provides a method of calibrating the wavelength of a target instrument, based on a calibration model developed for a primary instrument. The method comprises: (a) obtaining a reference set of at least two wavelength calibration parameters for the primary instrument; (b) obtaining a target set of at least two corresponding wavelength calibration parameters for the target instrument; (c) measuring a reference spectral response of a sample with the primary instrument; (d) measuring a target spectral response of the sample with the target instrument; (e) iteratively adjusting the target set of wavelength calibration parameters; (f) for each target set of wavelength calibration parameters, determining spectral residuals corresponding to that target set; and (g) selecting an optimum set of wavelength calibration parameters based on the spectral residuals for each target set of wavelength calibration parameters.
    Type: Grant
    Filed: April 15, 2002
    Date of Patent: March 2, 2004
    Assignee: CME Telemetrix, Inc.
    Inventors: Theodore E Cadell, Geng Lu