Patents by Inventor Gentaro Ishihara

Gentaro Ishihara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10983004
    Abstract: A spectrum correction device includes an analyzer configured to analyze a shape of an optical spectrum obtained by measuring a light to be measured using spectrum data representing the optical spectrum, a corrector configured to perform a correction process according to the shape of the optical spectrum to the spectrum data based on an analysis result of the analyzer, and a synthesizer configured to synthesize the spectrum data corrected by the corrector.
    Type: Grant
    Filed: April 15, 2019
    Date of Patent: April 20, 2021
    Assignees: Yokogawa Electric Corporation, YOKOGAWA TEST & MEASUREMENT CORPORATION
    Inventors: Gentaro Ishihara, Manabu Kojima
  • Patent number: 10754990
    Abstract: A measurement device is provided. The measurement device includes a display, a detector, an operation unit, and a central processing unit. The detector detects a physical quantity and outputs measurement data based on the detected physical quantity. The operation unit includes plural keys for performing operation functions for operating the measurement device to detect and output the measurement data. The central processing unit controls the display to display the measurement data on the display, and to lock the operation unit such that all of the operation functions are temporarily inoperable except for an unlocking function and one or more of the operation functions that is set to be selectively operable even when the operation unit is locked.
    Type: Grant
    Filed: September 15, 2016
    Date of Patent: August 25, 2020
    Assignees: Yokogawa Electric Corporation, YOKOGAWA TEST & MEASUREMENT CORPORATION
    Inventors: Gentaro Ishihara, Tohru Mori
  • Publication number: 20190323887
    Abstract: A spectrum correction device includes an analyzer configured to analyze a shape of an optical spectrum obtained by measuring a light to be measured using spectrum data representing the optical spectrum, a corrector configured to perform a correction process according to the shape of the optical spectrum to the spectrum data based on an analysis result of the analyzer, and a synthesizer configured to synthesize the spectrum data corrected by the corrector.
    Type: Application
    Filed: April 15, 2019
    Publication date: October 24, 2019
    Applicants: Yokogawa Electric Corporation, Yokogawa Test & Measurement Corporation
    Inventors: Gentaro ISHIHARA, Manabu KOJIMA
  • Publication number: 20170076115
    Abstract: An electronic device includes a display unit, and an operation unit. The electronic device has a lock function of locking operation functions on the operation unit such that the operation functions are temporarily inoperable. At least one of the operation functions is set to be selectively operable even in a lock state.
    Type: Application
    Filed: September 15, 2016
    Publication date: March 16, 2017
    Applicants: YOKOGAWA ELECTRIC CORPORATION, YOKOGAWA METERS & INSTRUMENTS CORPORATION
    Inventors: Gentaro ISHIHARA, Tohru MORI
  • Publication number: 20150057977
    Abstract: An optical measuring apparatus includes a measuring device configured to measure, by a shot unit, data in a predetermined wavelength range, a controller configured to analyze the measured data, a storage storing the measured data of a plurality of shots and the analysis results of the measured data, and a display configured to display the analysis results and waveform data based on the measured data on a single display screen.
    Type: Application
    Filed: August 19, 2014
    Publication date: February 26, 2015
    Applicants: YOKOGAWA METERS & INSTRUMENTS CORPORATION, YOKOGAWA ELECTRIC CORPORATION
    Inventor: Gentaro ISHIHARA
  • Patent number: 7456626
    Abstract: A measurement device is provided for measuring a predetermined physical quantity which is contained in the measurement signal over a predetermined measurement range which relates to a specific property for the physical quantity according to the measurement signal which is obtained from an object for measurement so as to display the measurement result as an image in a measurement display which comprises a display range setting section which sets the measurement range, a measurement display generating section which generates the measurement display by using the measurement result in a display range which is set by the measurement range setting section among the measurement result which is measured over the measurement range which is set by the measurement range setting section, and a display section which displays the measurement display which is generated by the measurement display generating section.
    Type: Grant
    Filed: April 7, 2005
    Date of Patent: November 25, 2008
    Assignee: Yokogawa Electric Corporation
    Inventors: Gentaro Ishihara, Tohru Mori
  • Publication number: 20050179683
    Abstract: A measurement device is provided for measuring a predetermined physical quantity which is contained in the measurement signal over a predetermined measurement range which relates to a specific property for the physical quantity according to the measurement signal which is obtained from an object for measurement so as to display the measurement result as an image in a measurement display which comprises a display range setting section which sets the measurement range, a measurement display generating section which generates the measurement display by using the measurement result in a display range which is set by the measurement range setting section among the measurement result which is measured over the measurement range which is set by the measurement range setting section, and a display section which displays the measurement display which is generated by the measurement display generating section.
    Type: Application
    Filed: April 7, 2005
    Publication date: August 18, 2005
    Inventors: Gentaro Ishihara, Tohru Mori
  • Patent number: 6898001
    Abstract: Output light spectrum P2(?) data from an optical amplifier and input light spectrum P1(?) data of signal light are prepared, the difference between the P2(?) and a value obtained by multiplying the P1(?) by a provisional gain GT is determined (Steps S232), for the obtained spectrum data, a noise removing process such as a moving average process and the like is performed and then, a spline interpolation process is also performed, whereby ASE light spectrum P3(?) data is prepared and an ASE light level P ASE is determined (Steps S233 through S235). In addition, a noise figure-measuring device 10 calculates the number of channels of WDM light and signal light wavelengths of the respective channels based on the P1(?) or P2(?), and performs analysis to calculate a noise figure NF and the like of an appointed wavelength range around the center of each wavelength thus calculated.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: May 24, 2005
    Assignee: Ando Electric Co., Ltd.
    Inventors: Gentaro Ishihara, Tohru Mori
  • Patent number: 6707547
    Abstract: In a method of analyzing wavelength-division multiplexed signal light, a plurality of reference wavelengths (&lgr;C1-&lgr;Cm) as preliminary specified by the ITU-T standards are stored in a memory; then, maximum points of light intensity are determined from waveform data obtained by measuring an actual wavelength-division multiplexed optical spectrum; any one of the maximum points which at least differs in light intensity from the two minimum points, one being right to said maximum point and the other being left, by at least a channel identifying threshold (TH) level is identified as a channel, and the wavelength of the identified channel is determined as &lgr;Dn; then, the &lgr;Dn for each channel is rounded to the value of the nearest ITU-T grid wavelength &lgr;Cm so as to determine the reference wavelength &lgr;An for each channel and the determined reference wavelengths &lgr;An are stored in the memory.
    Type: Grant
    Filed: May 8, 2001
    Date of Patent: March 16, 2004
    Assignee: Ando Electric Co., Ltd.
    Inventor: Gentaro Ishihara
  • Publication number: 20020089665
    Abstract: Output light spectrum P2(&lgr;) data from an optical amplifier and input light spectrum P1(&lgr;) data of signal light are prepared, the difference between the P2(&lgr;) and a value obtained by multiplying the P1(&lgr;) by a provisional gain GT is determined (Steps S232), for the obtained spectrum data, a noise removing process such as a moving average process and the like is performed and then, a spline interpolation process is also performed, whereby ASE light spectrum P3(&lgr;) data is prepared and an ASE light level P ASE is determined (Steps S233 through S235). In addition, a noise figure-measuring device 10 calculates the number of channels of WDM light and signal light wavelengths of the respective channels based on the P1(&lgr;) or P2(&lgr;), and performs analysis to calculate a noise figure NF and the like of an appointed wavelength range around the center of each wavelength thus calculated.
    Type: Application
    Filed: November 28, 2001
    Publication date: July 11, 2002
    Inventors: Gentaro Ishihara, Tohru Mori
  • Publication number: 20020005948
    Abstract: In a method of analyzing wavelength-division multiplexed signal light, a plurality of reference wavelengths (&lgr;C1-&lgr;Cm) as preliminary specified by the ITU-T standards are stored in a memory; then, maximum points of light intensity are determined from waveform data obtained by measuring an actual wavelength-division multiplexed optical spectrum; any one of the maximum points which at least differs in light intensity from the two minimum points, one being right to said maximum point and the other being left, by a channel identifying threshold (TH) level or more is identified as a channel, and the wavelength of the identified channel is determined as &lgr;Dn; then, the &lgr;Dn for each channel is rounded to the value of the nearest ITU-T grid wavelength &lgr;Cm so as to determine the reference wavelength &lgr;An for each channel and the determined reference wavelengths &lgr;An are stored in the memory.
    Type: Application
    Filed: May 8, 2001
    Publication date: January 17, 2002
    Inventor: Gentaro Ishihara