Abstract: A system for assisting elevator mechanics at completing the various tasks during a work day provides remote and automatic access to various kinds of information and communications. A planning module provides a prioritized task list for the mechanic to follow through the day. An information module provides the mechanic access to various types of safety, technical and location information to help the mechanic to arrive at locations and complete tasks in a more efficient manner. A communications module facilitates communication between the mechanic and elevator service company base locations through wireless communication links.

Abstract: A system has been invented for cutting wellbore casing and retrieving casing and a wellbore device connected thereto, the system, in one aspect, including engaging apparatus for releasably holding the wellbore device, casing cutting apparatus interconnected with and below the engaging apparatus for cutting casing in a wellbore, the wellbore device connected to the casing, and locking apparatus for selectively and releasably locking the engaging apparatus holding the wellbore device. In one aspect the engaging apparatus has one or more movable latching arms for releasably holding a wellbore device, e.g. but not limited to a wellhead and the arms are mounted below a top bonnet that holes therethrough so that the flushing of debris and/or cutting from the tops of the arms is facilitated. In one aspect, a drain sub is used to reduce flow to the casing cutter so that the circulation of debris and/or cuttings is inhibited.

Abstract: A probe card tester for detecting defects occurring as a result of integrated circuit processing of a substrate having a plurality of space to conductors with a contact at each end of each conductor, includes: a probe card tester including a set of parallel resistors for connecting at least one in parallel with each conductor and a set of series resistors for connecting together the ends of the conductors to form a series resistance and a number of probe elements, one corresponding to each end of each conductor, for interconnecting the parallel and series resistors with the conductors for detecting defects bridging the conductors.

Abstract: An interlevel conductor defect characterization integrated circuit test structure including first and second spaced test pads, a conductor layer, an insulator layer between the conductor layer and the test pads; and a first interlevel conductor having a unit cross-sectional conductive area extending between the first test pad and the conductor layer, and a second interlevel conductor extending between said second test pad and said conductor layer and having a cross-sectional conductive area substantially greater than the unit area for detecting defects which restrict the current carrying capacity of said unit area of the first interlevel conductor but not the second interlevel conductor.