Abstract: A phase contrast detection limit test slide is described for testing a phase contrast microscope. The test slide comprises a series of devices each having a first end and an opposing second end and comprising a plurality of phase objects disposed substantially between the first and second ends. The phase objects are formed by formed by nanometre fabrication techniques. The plurality of phase objects of any one device have a single phase angle in the range of about 2° to about 8°, and the devices are arranged over the test slide so that the phase angle increases across the series of devices. Each plurality of phase objects is further arranged substantially in the centre of concentric guides provided on each device to guide the eye to the phase objects, and a cover slip disposed over the devices. Also described is a process for using the test slide.

Abstract: A phase contrast detection limit test slide is described for testing a phase contrast microscope. The test slide comprises a series of devices each having a first end and an opposing second end and comprising a plurality of phase objects disposed substantially between the first and second ends. The phase objects are formed by formed by nanometre fabrication techniques. The plurality of phase objects of any one device have a single phase angle in the range of about 2° to about 8°, and the devices are arranged over the test slide so that the phase angle increases across the series of devices. Each plurality of phase objects is further arranged substantially in the centre of concentric guides provided on each device to guide the eye to the phase objects, and a cover slip disposed over the devices. Also described is a process for using the test slide.