Patents by Inventor Geoffrey K. Abbott

Geoffrey K. Abbott has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Regional pattern density determination method and system
    Patent number: 7703053
    Abstract: A method and system of determining a localized measure of regional pattern density in a fabrication process of a chip are disclosed. In one embodiment, the method includes determining pattern density values for each cell of a plurality of cells of interest; averaging the pattern density values for each cell within a first selected region about a target cell to determine the localized measure of regional pattern density for the target cell; storing the localized measure of regional pattern density for the target cell; and repeating the averaging and the storing for each of the plurality of cells. The simplification of data allows for a localized measure of regional pattern density determination in much less time than conventional techniques.
    Type: Grant
    Filed: December 5, 2006
    Date of Patent: April 20, 2010
    Assignee: International Business Machines Corporation
    Inventors: Geoffrey K. Abbott, Howard S. Landis, David P. Parker
  • REGIONAL PATTERN DENSITY DETERMINATION METHOD AND SYSTEM
    Publication number: 20080134111
    Abstract: A method and system of determining a localized measure of regional pattern density in a fabrication process of a chip are disclosed. In one embodiment, the method includes determining pattern density values for each cell of a plurality of cells of interest; averaging the pattern density values for each cell within a first selected region about a target cell to determine the localized measure of regional pattern density for the target cell; storing the localized measure of regional pattern density for the target cell; and repeating the averaging and the storing for each of the plurality of cells. The simplification of data allows for a localized measure of regional pattern density determination in much less time than conventional techniques.
    Type: Application
    Filed: December 5, 2006
    Publication date: June 5, 2008
    Applicant: International Business Machines Corporation
    Inventors: Geoffrey K. Abbott, Howard S. Landis, David P. Parker