Patents by Inventor Georg Ernest Fantner

Georg Ernest Fantner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device of using a scanning probe microscope
    Patent number: 11112426
    Abstract: A scanning probe microscope for high-speed imaging and/or nanomechanical mapping including a scanning probe comprising a cantilever with a tip at the distal end, and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.
    Type: Grant
    Filed: May 11, 2016
    Date of Patent: September 7, 2021
    Assignee: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Adrian Pascal Nievergelt
  • Multilayer MEMS cantilevers
    Patent number: 10308500
    Abstract: The present invention relates to a cantilever or membrane comprising a body and an elongated beam attached to the body. The elongated beam includes a first layer comprising a first material, a second layer comprising a second material having an elastic modulus different to that of the first material, a third layer comprising a third material having an elastic modulus different to that of the first material, where the first layer is sandwiched between the second layer and the third layer.
    Type: Grant
    Filed: May 23, 2016
    Date of Patent: June 4, 2019
    Assignee: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Nahid Hosseini
  • MULTILAYER MEMS CANTILEVERS
    Publication number: 20180141801
    Abstract: The present invention relates to a cantilever or membrane comprising a body and an elongated beam attached to the body. The elongated beam includes a first layer comprising a first material, a second layer comprising a second material having an elastic modulus different to that of the first material, a third layer comprising a third material having an elastic modulus different to that of the first material, where the first layer is sandwiched between the second layer and the third layer.
    Type: Application
    Filed: May 23, 2016
    Publication date: May 24, 2018
    Inventors: Georg Ernest FANTNER, Jonathan David ADAMS, Nahid HOSSEINI
  • Method and Device of Using a Scanning Probe Microscope
    Publication number: 20180106830
    Abstract: a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.
    Type: Application
    Filed: May 11, 2016
    Publication date: April 19, 2018
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Adrian Pascal Nievergelt
  • Resonance compensation in scanning probe microscopy
    Patent number: 8347409
    Abstract: A method includes generating, using a sensor, a data signal. The data signal includes a first component based on a motion in a first direction of an actuator configured to provide motion between a sample and a probe in the first direction, the first direction substantially in the plane of the sample; and a second component based on at least one of topographic variations of the sample in a second direction, and a materials property of the sample. The method further includes generating, using a processor, a compensatory signal based on the first component of the data signal generated by the sensor; and providing the compensatory signal to the actuator.
    Type: Grant
    Filed: May 24, 2010
    Date of Patent: January 1, 2013
    Assignee: Massachusetts Institute of Technology
    Inventors: Daniel James Burns, Georg Ernest Fantner, Kamal Youcef-Toumi
  • RESONANCE COMPENSATION IN SCANNING PROBE MICROSCOPY
    Publication number: 20110289635
    Abstract: A method includes generating, using a sensor, a data signal. The data signal includes a first component based on a motion in a first direction of an actuator configured to provide motion between a sample and a probe in the first direction, the first direction substantially in the plane of the sample; and a second component based on at least one of topographic variations of the sample in a second direction, and a materials property of the sample. The method further includes generating, using a processor, a compensatory signal based on the first component of the data signal generated by the sensor; and providing the compensatory signal to the actuator.
    Type: Application
    Filed: May 24, 2010
    Publication date: November 24, 2011
    Applicant: Massachusetts Institute of Technology
    Inventors: Daniel James Burns, Georg Ernest Fantner, Kamal Youcef-Toumi