Abstract: In-situ optical spectroscopic monitoring, characterization and feedback control of extraction and purification processes of compounds such as oils, alkaloids, flavonoids, terpenes and cannabinoids derived from plant material are described. Liquids from an extraction or purification process flow down an optically transparent tube, such as one made of glass. An in-situ optical monitoring assembly is configured to be mounted onto the tube to measure optical properties of the liquid extract or liquid condensate as it flows in the tube. Optical properties of the flowing liquid may include optical transmittance, reflectance, photoluminescence, scattering, absorbance, turbidity, nephelometry, polarimetry and colorimetry. The output of the optical monitoring assembly can be used to display spectral and other about the flowing liquid, set alarms to notify an operator of a predetermined condition such as a set point, and used to control extraction or purification process.

Abstract: A processing system monitors and/or controls a surface modification process occurring on a substrate within a processing chamber. An optical processing module having a light emission submodule to output a generated light signal and an optical detection submodule to detect a resultant light signal, is connected via fiber optic cables to light illuminating and light receiving components located within the chamber. A processor determines an amount of atomic absorption by an atomic element encountered by a probing beam passing between the illuminating and receiving components, based on the intensity of the generated light signal, the intensity of the received light signal and optionally the spontaneous emission of the atomic element in the absence of illumination by a probing beam. Based on the determined amount, the system derives a plurality of parameters of the modified substrate, their spatial and temporal uniformity, and information about process conditions in the processing chamber.

Abstract: A processing system monitors and/or controls a surface modification process occurring on a substrate within a processing chamber. An optical processing module having a light emission submodule to output a generated light signal and an optical detection submodule to detect a resultant light signal, is connected via fiber optic cables to light illuminating and light receiving components located within the chamber. A processor determines an amount of atomic absorption by an atomic element encountered by a probing beam passing between the illuminating and receiving components, based on the intensity of the generated light signal, the intensity of the received light signal and optionally the spontaneous emission of the atomic element in the absence of illumination by a probing beam. Based on the determined amount, the system derives a plurality of parameters of the modified substrate, their spatial and temporal uniformity, and information about process conditions in the processing chamber.

Abstract: A processing system monitors and/or controls a surface modification process occurring on a substrate within a processing chamber. An optical processing module having a light emission submodule to output a generated light signal and an optical detection submodule to detect a resultant light signal, is connected via fiber optic cables to light illuminating and light receiving components located within the chamber. A processor determines an amount of atomic absorption by an atomic element encountered by a probing beam passing between the illuminating and receiving components, based on the intensity of the generated light signal, the intensity of the received light signal and optionally the spontaneous emission of the atomic element in the absence of illumination by a probing beam. Based on the determined amount, the system derives a plurality of parameters of the modified substrate, their spatial and temporal uniformity, and information about process conditions in the processing chamber.

Abstract: A processing system monitors and/or controls a surface modification process occurring on a substrate within a processing chamber. An optical processing module having a light emission submodule to output a generated light signal and an optical detection submodule to detect a resultant light signal, is connected via fiber optic cables to light illuminating and light receiving components located within the chamber. A processor determines an amount of atomic absorption by an atomic element encountered by a probing beam passing between the illuminating and receiving components, based on the intensity of the generated light signal, the intensity of the received light signal and optionally the spontaneous emission of the atomic element in the absence of illumination by a probing beam. Based on the determined amount, the system derives a plurality of parameters of the modified substrate, their spatial and temporal uniformity, and information about process conditions in the processing chamber.

Abstract: In-situ optical spectroscopic monitoring, characterization and feedback control of extraction and purification processes of compounds such as oils, alkaloids, flavonoids, terpenes and cannabinoids derived from plant material are described. Liquids from an extraction or purification process flow down an optically transparent tube, such as one made of glass. An in-situ optical monitoring assembly is configured to be mounted onto the tube to measure optical properties of the liquid extract or liquid condensate as it flows in the tube. Optical properties of the flowing liquid may include optical transmittance, reflectance, photoluminescence, scattering, absorbance, turbidity, nephelometry, polarimetry and colorimetry. The output of the optical monitoring assembly can be used to display spectral and other about the flowing liquid, set alarms to notify an operator of a predetermined condition such as a set point, and used to control extraction or purification process.

Abstract: A method and system for modifying a substrate, such a thin film, solar panel or the like detects error and/or variance and, if needed, re-optimizes the product design and/or process parameters on the fly, so that product can meet the product specification. This allows for methods and systems of process control that can adaptively change the product design in real time.

Abstract: A method and system for modifying a substrate, such a thin film, solar panel or the like detects error and/or variance and, if needed, re-optimizes the product design and/or process parameters on the fly, so that product can meet the product specification. This allows for methods and systems of process control that can adaptively change the product design in real time.