Abstract: Systems and methods for testing a circuit are provided. In one example, a sequential device for use in a scan chain is described. The sequential device may include a scan input, a scan output and a functional data output. The functional data output may be coupled to the scan input and to the scan output. The functional data output may be coupled to the scan output via a delay buffer.

Abstract: Systems and methods for testing a circuit are provided. In one example, a sequential device for use in a scan chain is described. The sequential device may include a scan input, a scan output and a functional data output. The functional data output may be coupled to the scan input and to the scan output. The functional data output may be coupled to the scan output via a delay buffer.

Abstract: Systems and methods for testing a circuit are provided. In one example, a sequential device for use in a scan chain is described. The sequential device may include a scan input, a scan output and a functional data output. The functional data output may be coupled to the scan input and to the scan output. The functional data output may be coupled to the scan output via a delay buffer.

Abstract: A master/slave flipflop uses a reset circuit to initialize its output to a known state. A data input signal and a reference signal are received at first and second inputs of a differential transistor input stage respectively for developing first and second output signals having opposite logic states at first and second nodes. A locking circuit locks the logic states of the first and second output signals at the first and second nodes respectively. A reset circuit reduces the second output signal at the second node upon receiving a reset signal to establish a logic low state at the second node and a logic high state at the first node which transfer through the slave portion as the output signals of the flipflop circuit.