Abstract: A switchable electrical connector for automatically terminating signals in distribution equipment is provided, particularly in the form of a tap housing containing the F-port connector which when installed in a CATV system, is switchable to selectively supply RF with power to customers who subscribe to telephone service; and to provide only RF (5Hz-1GHz) to customers who subscribe only to cable television service.

Abstract: An electrical connector for automatically terminating signals in distribution equipment is provided, particularly in the form of a tap housing containing the F-port connector installed in a CATV system. The connector includes a cylindrical outer conductor for attachment to a housing of the distribution equipment which contains a pcb, a conductor of a coaxial cable being connectable to said outer conductor; an inner resilient conductor member contained in the outer conductor and connectable to an electrical circuit when contacting the pcb, a conductor of a coaxial cable being connectable to the inner resilient conductor member; and signal terminating means comprising a resistor operatively associated with the resilient conductor member and the pcb whereby an electrical circuit may be selectively opened and closed to automatically terminate the signals when the inner resilient conductor member has contact with the pcb.

Abstract: A chip carrier socket for solid state electronic chip carrier packaged elements made up of a hollow body having a cover, a hinged top on the body providing a space between the top and the body, a chip carrier to be placed in the space and serpentine shaped springs in the hollow body and extending upwardly therethrough to engage electronic metalized pad areas on said chip carrier package. The lower end of the springs being adapted to rest on a bottom closure, the lower ends of the springs extending out through the bottom closure and the upper end of the springs extending through the top of the body and being slidable relative thereto.

Abstract: A dynamic signal generating circuit for exercising semiconductors and other electronic devices and circuits which includes first and second address selectors, first and second PROM address counters connected to said first and second address selectors respectively, first and second interval timer PROMs connected to said first and second address counters respectively, first and second output signal PROMs connected to said first and second interval PROMs respectively and means to connect said first output signal PROMs through clock and address drivers to a device under test and means to connect said second output signal PROMs through clock drivers to said device being tested and means connecting said first output PROMs through data drivers to said device being tested whereby said circuit controls a dynamic signal pattern system for exercising said semiconductors or other electronic devices and circuits.