Patents by Inventor George E. Von Dolteren

George E. Von Dolteren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6603362
    Abstract: A reduced phase noise multiplication, digitally controlled frequency synthesizer employs a subsampling digitizer to downconvert (perform ‘constructive aliasing’ of) the synthesizer's output frequency to baseband for precision tuning of the synthesizer's output frequency in a digitally controlled phase locked loop. The use of a digitally controlled phase locked loop allows the stepsize of the synthesizer output frequency to be controlled in very small (e.g., sub-Hertz) increments. Since the phase locked loop uses all digital components for tuning control, no additional frequency division by the loop is required. This means that only the value of the subharmonic ratio ‘n’ of the subsampling clock to the analog-to-digital converter will determine multiplicative phase noise error.
    Type: Grant
    Filed: March 14, 2000
    Date of Patent: August 5, 2003
    Assignee: Intersil Americas Inc.
    Inventor: George E. Von Dolteren, Jr.
  • Publication number: 20020084856
    Abstract: A reduced phase noise multiplication, digitally controlled frequency synthesizer employs a subsampling digitizer to downconvert (perform ‘constructive aliasing’ of) the synthesizer's output frequency to baseband for precision tuning of the synthesizer's output frequency in a digitally controlled phase locked loop. The use of a digitally controlled phase locked loop allows the stepsize of the synthesizer output frequency to be controlled in very small (e.g., sub-Hertz) increments. Since the phase locked loop uses all digital components for tuning control, no additional frequency division by the loop is required. This means that only the value of the subharmonic ratio ‘n’ of the subsampling clock to the analog-to-digital converter will determine multiplicative phase noise error.
    Type: Application
    Filed: March 14, 2000
    Publication date: July 4, 2002
    Inventor: George E. Von Dolteren, Jr.
  • Patent number: 5861826
    Abstract: The calibration method preferably comprises the steps of: driving the analog-to-digital converter (ADC) with at least one test signal; calibrating the driven ADC over a series of successive ADC calibrations; generating a series of successive ADC figure of merit measurements for respective successive ADC calibrations, the series of successive ADC figure of merit measurements defining at least a portion of a curve having a local minimum/maximum; and stopping calibrating at an ADC calibration corresponding to the local minimum/maximum of the curve defined by the series of successive ADC figure of merit measurements. The step of calibrating preferably comprises incrementally calibrating the ADC over the series of successive ADC calibrations. The method preferably further comprises the step of determining the local minimum/maximum of the curve.
    Type: Grant
    Filed: June 30, 1997
    Date of Patent: January 19, 1999
    Assignee: Harris Corporation
    Inventors: Tzi-Hsiung Shu, George E. Von Dolteren