Patents by Inventor George G. He

George G. He has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for comparative interferogram spectrometry
    Patent number: 7869050
    Abstract: A method for determining a background noise level includes receiving interferogram data; determining at least one measure of interferogram quality; accumulating said received interferogram data; and generating a background noise level based on said interferogram data and at least one measure of interferogram quality.
    Type: Grant
    Filed: August 13, 2009
    Date of Patent: January 11, 2011
    Assignee: Eoir Technologies, Inc.
    Inventors: George G. He, Diane E. Deterline
  • Systems and Methods for Comparative Interferogram Spectrometry
    Publication number: 20090296097
    Abstract: A method for determining a background noise level includes receiving interferogram data; determining at least one measure of interferogram quality; accumulating said received interferogram data; and generating a background noise level based on said interferogram data and at least one measure of interferogram quality.
    Type: Application
    Filed: August 13, 2009
    Publication date: December 3, 2009
    Applicant: EOIR TECHNOLOGIES, INC.
    Inventors: George G. He, Diane E. Deterline
  • Systems and methods for comparative interferogram spectrometry
    Patent number: 7593112
    Abstract: A system for comparative interferogram spectrometry includes an interferometer configured to generate interferograms from incident radiation from a target region, an interferogram database containing stored interferograms, and a processing subsystem configured to receive the generated interferograms and compare the received interferograms to the stored interferograms.
    Type: Grant
    Filed: October 2, 2006
    Date of Patent: September 22, 2009
    Assignee: EOIR Technologies, Inc.
    Inventors: George G. He, Diane E. Deterline
  • Systems and methods for comparative interferogram spectrometry
    Publication number: 20080084564
    Abstract: A system for comparative interferogram spectrometry includes an interferometer configured to generate interferograms from incident radiation from a target region, an interferogram database containing stored interferograms, and a processing subsystem configured to receive the generated interferograms and compare the received interferograms to the stored interferograms.
    Type: Application
    Filed: October 2, 2006
    Publication date: April 10, 2008
    Inventors: George G. He, Diane E. Deterline
  • Method and algorithm for image processing
    Patent number: 6665449
    Abstract: The present invention is a modified Radon transform. It is similar to the traditional Radon transform for the extraction of line parameters and similar to traditional slant stack for the intensity summation of pixels away from a given pixel, for example ray paths that spans 360 degree at a given grid in the time and offset domain. However, the present invention differs from these methods in that the intensity and direction of a composite intensity for each pixel are maintained separately instead of combined after the transformation. An advantage of this approach is elimination of the work required to extract the line parameters in the transformed domain. The advantage of the modified Radon Transform method is amplified when many lines are present in the imagery or when the lines are just short segments which both occur in actual imagery.
    Type: Grant
    Filed: September 3, 1999
    Date of Patent: December 16, 2003
    Assignee: Battelle Memorial Institute
    Inventors: George G. He, Brain D. Moon