Patents by Inventor George J. Chen
George J. Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240127451Abstract: Described herein are methods and computer systems for classification of CD8 T-cell topology using a patient response-based linear cutoff model. A plurality of histology images of tissue samples in a plurality of patients are received by a computer system. An image analysis of the plurality of histology images is performed to obtain a CD8+ T-cell abundance in the tumor parenchyma and stroma in each of the plurality of histology images. Real inflammation scores and tumor infiltration scores are determined based on a polar coordinate transformation of the CD8+ T-cell abundance in the tumor parenchyma and stroma. Based on the real inflammation scores and tumor infiltration scores, a feature space is generated, and linear boundaries or linear cutoffs between a plurality of classifications in the feature space are identified based on the real inflammation scores, the tumor infiltration scores, and patient response data.Type: ApplicationFiled: February 25, 2022Publication date: April 18, 2024Applicant: Bristol-Myers Squibb CompanyInventors: George C. Lee, Robin Edwards, Scott Ely, Daniel N. Cohen, John B. Wojcik, Vipul A. Baxi, Dimple Pandya, Jimena Trillo-Tinoco, Benjamin J. Chen, Andrew Fisher, Falon Gray
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Patent number: 8799842Abstract: Systems, methods, and other embodiments associated with analyzing interconnects for global wires of a circuit are described. In one embodiment, for a target wire in a circuit design, a method includes determining an inductance value and a capacitance value for parallel wires to the target wire. The method then calculates a second capacitance value for non-parallel wires to the target wire and calculates an estimated inductance value for the non-parallel wires based on the second capacitance value. A circuit model for the target wire may then be generated using the inductance and capacitance values.Type: GrantFiled: September 10, 2012Date of Patent: August 5, 2014Assignee: Oracle International CorporationInventors: Bogdan Tutuianu, George J. Chen
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Publication number: 20140075405Abstract: Systems, methods, and other embodiments associated with analyzing interconnects for global wires of a circuit are described. In one embodiment, for a target wire in a circuit design, a method includes determining an inductance value and a capacitance value for parallel wires to the target wire. The method then calculates a second capacitance value for non-parallel wires to the target wire and calculates an estimated inductance value for the non-parallel wires based on the second capacitance value. A circuit model for the target wire may then be generated using the inductance and capacitance values.Type: ApplicationFiled: September 10, 2012Publication date: March 13, 2014Applicant: Oracle International CorporationInventors: Bogdan TUTUIANU, George J. CHEN
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Patent number: 7958474Abstract: Various methods and apparatus for executing a multithreaded algorithm that performs a static timing analysis of an integrated circuit chip (chip) include logic for traversing the chip to identify a plurality of components (cells or nodes) within a chip circuit of the chip. A waveform graph is defined for the identified nodes. One or more virtual graphs are generated from the waveform graph. The plurality of nodes in the one or more virtual graphs are processed using multiple threads to obtain quadruplet of time domain dataset values representing the different modes of propagation for each node. A timing check is performed at an end node of the virtual graphs using the quadruplet of time domain dataset values to determine any timing violation within the chip design.Type: GrantFiled: June 26, 2008Date of Patent: June 7, 2011Assignee: Oracle America, Inc.Inventors: George J Chen, Gilda Garreton, Steven M Rubin, Robert E Mains
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Patent number: 7797658Abstract: A method and apparatus for executing multithreaded algorithm to provide static timing analysis of a chip design includes analyzing a chip design to identify various components and nodes associated with the components. A node tree is built with a plurality of nodes. The node tree identifies groups of nodes that are available in different levels. A size of node grouping for a current level is determined by looking up the node tree. Testing data for parallel processing of different size of node groupings using varied thread counts is compiled. An optimum thread count for the current level based on the size of node grouping in the node tree is identified from compiled testing data. Dynamic parallel processing of nodes in the current level is performed using the number of threads identified by the optimum thread count. An acceptable design of the chip is determined by the dynamic parallel processing.Type: GrantFiled: October 22, 2007Date of Patent: September 14, 2010Assignee: Oracle America, Inc.Inventors: George J. Chen, Darryl J. Gove, Robert E. Mains
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Publication number: 20090327985Abstract: Various methods and apparatus for executing a multithreaded algorithm that performs a static timing analysis of an integrated circuit chip (chip) include logic for traversing the chip to identify a plurality of components (cells or nodes) within a chip circuit of the chip. A waveform graph is defined for the identified nodes. One or more virtual graphs are generated from the waveform graph. The plurality of nodes in the one or more virtual graphs are processed using multiple threads to obtain quadruplet of time domain dataset values representing the different modes of propagation for each node. A timing check is performed at an end node of the virtual graphs using the quadruplet of time domain dataset values to determine any timing violation within the chip design.Type: ApplicationFiled: June 26, 2008Publication date: December 31, 2009Inventors: George J. Chen, Gilda Garreton, Steven M. Rubin, Robert E. Mains
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Publication number: 20090106717Abstract: A method and apparatus for executing multithreaded algorithm to provide static timing analysis of a chip design includes analyzing a chip design to identify various components and nodes associated with the components. A node tree is built with a plurality of nodes. The node tree identifies groups of nodes that are available in different levels. A size of node grouping for a current level is determined by looking up the node tree. Testing data for parallel processing of different size of node groupings using varied thread counts is compiled. An optimum thread count for the current level based on the size of node grouping in the node tree is identified from compiled testing data. Dynamic parallel processing of nodes in the current level is performed using the number of threads identified by the optimum thread count. An acceptable design of the chip is determined by the dynamic parallel processing.Type: ApplicationFiled: October 22, 2007Publication date: April 23, 2009Inventors: George J. Chen, Darryl J. Gove, Robert E. Mains
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Patent number: 7376916Abstract: One embodiment of the present invention provides a system which performs a constrained optimization of circuit parameters. During operation, the system selects two circuit parameters associated with a circuit path, wherein the optimization is to be performed on the first circuit parameter while a limitation on second circuit parameter functions as a constraint on the optimization of the first circuit parameter. Next, the system generates objective functions which model the first circuit parameter and the second circuit parameter in terms of logical effort. The system then uses the objective functions to generate a constraint expression, wherein the constraint expression mathematically relates the optimization of the first circuit parameter to the constraint on the second circuit parameter. Next, the system computes a trade-off curve using the constraint expression. The system then computes transistor sizes for the circuit path based on a selected point from the trade-off curve.Type: GrantFiled: April 20, 2005Date of Patent: May 20, 2008Assignee: Sun Microsystems, Inc.Inventors: Jo C. Ebergen, George J. Chen
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Patent number: 7051305Abstract: A method of estimating delay which includes configuring a first signal path and second signal path such that the first signal path is a victim signal path and the second signal path is an aggressor signal path, calculating Miller factors between the victim signal path and the aggressor signal path for a plurality of edge combinations between a victim signal edge and an aggressor signal edge, and using the Miller factors to perform a timing analysis.Type: GrantFiled: April 27, 2004Date of Patent: May 23, 2006Assignee: Sun Microsystems, Inc.Inventors: Hien T. Ha, George J. Chen, Robert E. Mains
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Patent number: 5929619Abstract: A voltage regulator having improved noise immunity includes a reference counter, a digital reference generator coupled to the reference generator, a comparator coupled to the digital reference generator, a load response control circuit coupled to the comparator output, a digital pulse width memory circuit coupled the load response control output, and a digital pulse width timer circuit coupled to the pulse width memory output and to the load response control circuit, wherein the digital pulse width timer circuit and the digital pulse width memory circuit each have greater digital resolution than the digital reference generator.Type: GrantFiled: April 22, 1998Date of Patent: July 27, 1999Assignee: Victory Industrial CorporationInventors: Cheng Hsi Chin, George J. Chen