Patents by Inventor George Logsdon
George Logsdon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 9235413Abstract: In semiconductor wafer manufacturing, processes such as analyzing test data associated with semiconductor wafers, interpreting the test data analysis, and acting on the test data interpretation and analysis are automated. Such automation can eliminate delays that were previously imposed by the action of test analysis engineers and wafer fabrication personnel, thereby reducing the amount of useless material that is produced before a process defect can be detected.Type: GrantFiled: August 3, 2005Date of Patent: January 12, 2016Assignee: National Semiconductor CorporationInventors: William MacDonald, George Logsdon, Matthew Lascom, Steven Craig Gessler
-
Patent number: 8417367Abstract: A manufacturing exception handling system is described for use with a manufacturing execution system that controls a semiconductor manufacturing process. The present invention provides real time information to the user that identifies restrictions that have been placed on the use of entities and inventories in the semiconductor manufacturing process. The present invention also provides real time information to the user that identifies the persons who are authorized to remove the restrictions. The present invention saves the time and effort that would otherwise be required to find out why a restriction existed and who could remove the restriction during the semiconductor manufacturing process.Type: GrantFiled: August 18, 2004Date of Patent: April 9, 2013Assignee: National Semiconductor CorporationInventors: George Logsdon, Ramesh Rao, Teresa Colpaert, Michael A. Hart
-
Patent number: 7826915Abstract: A system and method is disclosed for providing automatic qualification intervention in a manufacturing process that is performed by a plurality of components. At least one qualification process is associated with each of the components. The qualification processes are stored in a component/qualification matrix in a computerized database management system. The automatic qualification intervention system requires that all qualification processes for a component must be performed in conformity with the qualification processes for the component that have been stored in the component/qualification matrix. The automatic qualification intervention system significantly reduces the delays that are inherent in prior art methods.Type: GrantFiled: January 23, 2006Date of Patent: November 2, 2010Assignee: National Semiconductor CorporationInventors: George Logsdon, Gale Moericke, William MacDonald, Edward J. Francis
-
Patent number: 7784423Abstract: A delivery system for dispensing material onto a semiconductor wafer is provided that includes an opening device and a dispensing device. The opening device is operable to open a packet of material. The dispensing device is operable to dispense the material from the packet onto the semiconductor wafer.Type: GrantFiled: April 28, 2004Date of Patent: August 31, 2010Assignee: National Semiconductor CorporationInventor: George Logsdon
-
Patent number: 7725207Abstract: There are disclosed systems, as well as methods of operation, for allocating multi-function resources among a plurality of tasks within a process system. An exemplary resource allocator is introduced that allocates multi-function resources among tasks within a process system capable of executing at least one application process. The resource allocator comprises a monitoring controller, model of the process system and a resource allocation controller. The monitoring controller monitors measurable characteristics associated with the executing application process, multi-function resources and tasks, each of the measurable characteristics being one of a status characteristic and a logistical characteristic. The model represents mathematically the multi-function resources and the tasks, and defines relationships among related ones thereof as a function of the application process.Type: GrantFiled: October 17, 2005Date of Patent: May 25, 2010Assignee: National Semiconductor CorporationInventors: George Logsdon, Gary Elmore
-
Patent number: 7373211Abstract: A system and method is disclosed for allocating multi-function resources among a plurality of tasks within a process system in semiconductor wafer fabrication. A resource allocator allocates multi-function resources among tasks within a process system that executes at least one application process. The resource allocator comprises a monitoring controller, model of the process system, a resource allocation controller, and a compliance-monitoring viewer. The compliance-monitoring viewer is operable to display process system information to illustrate plan compliance, information visualized over a time period of years, months, days, hours, seconds, microseconds or the like.Type: GrantFiled: October 17, 2005Date of Patent: May 13, 2008Assignee: National Semiconductor CorporationInventors: George Logsdon, Gary Elmore, John T. Powell
-
Patent number: 7184850Abstract: A system and method is disclosed for allocating multi-function resources among a plurality of tasks within a wetdeck process in semiconductor wafer fabrication. A resource allocator allocates multi-function resources among tasks within a process system that executes at least one application process. The resource allocator comprises a monitoring controller, model of the process system and a resource allocation controller. The monitoring controller monitors measurable characteristics associated with the executing application process, multi-function resources and tasks. The model represents the multi-function resources and the tasks, and defines relationships among them. The resource allocation controller operates the model in response to the monitored measurable characteristics and allocates ones of the multi-function resources among ones of the tasks to efficiently execute the wetdeck process of the semiconductor wafer fabrication process.Type: GrantFiled: October 31, 2005Date of Patent: February 27, 2007Assignee: National Semiconductor CorporationInventors: George Logsdon, Gary Elmore, John Devlin
-
Patent number: 7065424Abstract: This invention introduces systems and methods that control production process quality, wherein the production process has a plurality of durable items, each durable item is associated with a re-qualification process initiated as a function of a life expectancy associated therewith. The life expectancy associated with each durable item is reset upon completion of the associated re-qualification process. An exemplary method comprises (I) monitoring re-qualification indicia associated with each associated re-qualification process, and (ii) controlling availability of re-qualified durable items of the production process as a function of the re-qualification indicia to thereby control production process quality.Type: GrantFiled: March 4, 2004Date of Patent: June 20, 2006Assignee: National Semiconductor CorporationInventors: William MacDonald, George Logsdon, Darren Lee Rust
-
Patent number: 7043319Abstract: A resource allocator allocates a plurality of resources among a plurality of tasks within a process system. The resource allocator includes a monitoring controller for monitoring one or more characteristics associated with at least one application process, the resources, and the tasks. The resource allocator also includes a model of the process system representing mathematically the resources and the tasks and defining relationships among related resources and tasks. The resource allocator further includes a resource allocation controller for operating the model in response to the monitored characteristics and allocating the resources among the tasks. In addition, the resource allocator includes a graphical user interface for identifying the resources and flows between at least some of the resources. The graphical user interface includes at least one virtual queue associated with at least one of the resources and identifying one or more items to be processed by the at least one resource.Type: GrantFiled: September 30, 2003Date of Patent: May 9, 2006Assignee: National Semiconductor CorporationInventors: George Logsdon, Gary Elmore, Avelito Hernal
-
Patent number: 6961634Abstract: A system and method is disclosed for allocating multi-function resources among a plurality of tasks within a wetdeck process in semiconductor wafer fabrication. A resource allocator allocates multi-function resources among tasks within a process system that executes at least one application process. The resource allocator comprises a monitoring controller, model of the process system and a resource allocation controller. The monitoring controller monitors measurable characteristics associated with the executing application process, multi-function resources and tasks. The model represents the multi-function resources and the tasks, and defines relationships among them. The resource allocation controller operates the model in response to the monitored measurable characteristics and allocates ones of the multi-function resources among ones of the tasks to efficiently execute the wetdeck process of the semiconductor wafer fabrication process.Type: GrantFiled: May 28, 2003Date of Patent: November 1, 2005Assignee: National Semiconductor CorporationInventors: George Logsdon, Gary Elmore, John Devlin
-
Patent number: 6959225Abstract: A system and method is disclosed for allocating multi-function resources among a plurality of tasks within a process system in semiconductor wafer fabrication. A resource allocator allocates multi-function resources among tasks within a process system that executes at least one application process. The resource allocator comprises a monitoring controller, model of the process system, a resource allocation controller, and a graphical user interface. The graphical user interface transforms process system information of the resource allocator into an audio-visual format to enable supervisory interaction. In one embodiment the graphical user interface provides information to reduce load conflict among multiple furnaces in semiconductor wafer fabrication.Type: GrantFiled: May 28, 2003Date of Patent: October 25, 2005Assignee: National Semiconductor CorporationInventors: George Logsdon, Gary Elmore, Loretta Mangram-Dupree
-
Patent number: 6957113Abstract: There are disclosed systems, as well as methods of operation, for allocating multi-function resources among a plurality of tasks within a process system. An exemplary resource allocator is introduced that allocates multi-function resources among tasks within a process system capable of executing at least one application process. The resource allocator comprises a monitoring controller, model of the process system and a resource allocation controller. The monitoring controller monitors measurable characteristics associated with the executing application process, multi-function resources and tasks, each of the measurable characteristics being one of a status characteristic and a logistical characteristic. The model represents mathematically the multi-function resources and the tasks, and defines relationships among related ones thereof as a function of the application process.Type: GrantFiled: November 19, 2002Date of Patent: October 18, 2005Assignee: National Semiconductor CorporationInventors: George Logsdon, Gary Elmore
-
Patent number: 6957114Abstract: A system and method is disclosed for allocating multi-function resources among a plurality of tasks within a process system in semiconductor wafer fabrication. A resource allocator allocates multi-function resources among tasks within a process system that executes at least one application process. The resource allocator comprises a monitoring controller, model of the process system, a resource allocation controller, and a compliance-monitoring viewer. The compliance-monitoring viewer is operable to display process system information to illustrate plan compliance, information visualized over a time period of years, months, days, hours, seconds, microseconds or the like.Type: GrantFiled: June 16, 2003Date of Patent: October 18, 2005Assignee: National Semiconductor CorporationInventors: George Logsdon, Gary Elmore, John T. Powell