Abstract: One or more systems, devices, and/or methods provided herein relate to a process for in-process radio frequency (RF) signal quality analysis and amplitude adjustment of one or more RF devices. In one or more embodiments, the RF device can comprise a portion of a quantum computing system, such as of readout electronics thereof, and thus amplitude adjustment can be at a waveform generator that generates pulses to affect one or more qubits of a quantum logic circuit of the quantum computing system. Generally, an electronic device can comprise an RF tap connected to an RF signal component of a first RF signal chain, and an analysis component connected to the RF tap, the analysis component configured to convert an RF signal from the RF signal component and to compare a conversion result thereof to an expected power output that is based on historical data for a second RF signal chain.

Abstract: A method of controlling a quantum computing output includes generating a baseline quantum computing signal from a quantum computing system. A controlled noise component is added to the quantum computing system. An output from the quantum computing system is read, wherein the output includes the controlled noise component. An effect on the baseline quantum computing signal due to the controlled noise component in the output is determined.

Abstract: An apparatus includes a sampling circuit, a sense circuit, and a tuning circuit. The sampling circuit samples an input signal according to a sampling clock signal to produce a sampled signal. The sense circuit determines a scaling factor based on a distortion in the sampled signal caused by the sampling clock signal. The tuning circuit generates an offset signal based on the sampling clock signal and the scaling factor. The offset signal reduces the distortion in the sampled signal caused by the sampling clock signal.

Abstract: Systems, computer-implemented methods and/or computer program products are provided for facilitating waveform synthesis. A system can comprise a memory that stores computer executable components and a processor that executes the computer executable components stored in the memory. The computer executable components can comprise a composing component that compresses data defining a waveform by employing amplitude partitioning of the data using equivalent sizing. The composing component can further employ run-length encoding to generate a string of integers representing a plurality of groups of the data as partitioned according both to amplitude and progressing time. In an embodiment, a decoding component can employ a binary search to decode a running sum array of integers representing at least a portion of the data, to decompress the data.

Abstract: A negative-operand compatible subtractor circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a difference output node to a voltage proportional to a difference between two received N-bit binary numbers. The subtractor circuit includes two sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The subtractor circuit includes two sets of scaled capacitors, each capacitor of two sets of scaled capacitors electrically connected to the difference output node. Each scaled capacitor has a capacitance equal to 2(n)*a unit capacitance (CUNIT). The subtractor circuit includes a reset circuit configured to draw, in response to a received RESET signal, the difference output node to ground. A control circuit of the subtractor is configured to, in conjunction with the reset circuit, draw the difference output node to a reset voltage.

Abstract: A multiplier circuit can be fabricated within an integrated circuit and can draw a product output node to a voltage proportional to a product of first and second binary numbers received at two sets of inputs. The multiplier circuit includes a first set of scaled capacitors connected to an output of a multiplexor and to a local product output node. Each multiplexor is connected to a second set of scaled capacitors configured to generate an analog voltage in proportion to the value of the first binary number. Each scaled capacitor of first set of scaled capacitors has a capacitance proportional to a significance of a respective bit of the second binary number. The multiplier circuit includes a reference capacitor connected to ground and the product output node, and a reset circuit configured to draw, in response to a RESET signal, the product output node to ground.

Abstract: A negative-operand compatible subtractor circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a difference output node to a voltage proportional to a difference between two received N-bit binary numbers. The subtractor circuit includes two sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The subtractor circuit includes two sets of scaled capacitors, each capacitor of two sets of scaled capacitors electrically connected to the difference output node. Each scaled capacitor has a capacitance equal to 2(n)*a unit capacitance (CUNIT). The subtractor circuit includes a reset circuit configured to draw, in response to a received RESET signal, the difference output node to ground. A control circuit of the subtractor is configured to, in conjunction with the reset circuit, draw the difference output node to a reset voltage.

Abstract: A multiplier circuit can be fabricated within an integrated circuit and can draw a product output node to a voltage proportional to a product of first and second binary numbers received at two sets of inputs. The multiplier circuit includes a set of scaled capacitors, each capacitor of the set connected to an output of a multiplexor and to a local product output node. Each multiplexor is connected to the output of a multiplexor configured to generate an analog voltage in proportion to the value of the first binary number. Each scaled capacitor has a capacitance proportional to a significance of a respective bit of the second binary number. The multiplier circuit includes a reference capacitor connected to ground and the product output node, and a reset circuit configured to draw, in response to a RESET signal, the product output node to ground.

Abstract: A multiplier circuit can be fabricated within an integrated circuit and can draw a product output node to a voltage proportional to a product of first and second binary numbers received at two sets of inputs. The multiplier circuit includes a set of scaled capacitors, each capacitor of the set connected to an output of a multiplexor and to a local product output node. Each multiplexor is connected to the output of a multiplexor configured to generate an analog voltage in proportion to the value of the first binary number. Each scaled capacitor has a capacitance proportional to a significance of a respective bit of the second binary number. The multiplier circuit includes a reference capacitor connected to ground and the product output node, and a reset circuit configured to draw, in response to a RESET signal, the product output node to ground.

Abstract: A multiplier circuit can be fabricated within an integrated circuit and can draw a product output node to a voltage proportional to a product of first and second binary numbers received at two sets of inputs. The multiplier circuit includes a first set of scaled capacitors connected to an output of a multiplexor and to a local product output node. Each multiplexor is connected to a second set of scaled capacitors configured to generate an analog voltage in proportion to the value of the first binary number. Each scaled capacitor of first set of scaled capacitors has a capacitance proportional to a significance of a respective bit of the second binary number. The multiplier circuit includes a reference capacitor connected to ground and the product output node, and a reset circuit configured to draw, in response to a RESET signal, the product output node to ground.

Abstract: A multiplier circuit can be fabricated within an integrated circuit and can draw a product output node to a voltage proportional to a product of two received binary numbers. The multiplier circuit includes two sets of inputs that receive binary numbers. The multiplier circuit includes a set of scaled capacitors, each capacitor of the set connected to an output of an AND gate and to a local product output node. Each AND gate is connected to a unique pair of bits, one bit from each of the two binary numbers. Each scaled capacitor has a capacitance proportional to a product term generated by the corresponding AND gate. The multiplier circuit includes a reference capacitor connected to ground and the product output node, and a reset circuit configured to draw, in response to a RESET signal, the product output node to ground.

Abstract: An adder circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a sum output node to a voltage proportional to a sum of received N-bit binary numbers. The adder circuit includes sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The adder circuit includes sets of scaled capacitors, each capacitor connected to an nth input of the corresponding set of N inputs and to the sum output node. Each scaled capacitor has a capacitance equal to 2(n)*a unit capacitance (CUNIT). The adder circuit includes a reference capacitor connected to ground and the sum output node, and a reset circuit configured to draw, in response to a received RESET signal, the sum output node to ground.

Abstract: A subtractor circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a difference output node to a voltage proportional to a difference between two received N-bit binary numbers. The subtractor circuit includes sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The subtractor circuit includes two sets of scaled capacitors, each capacitor of one set connected to an nth input of the corresponding set of N inputs and to the difference output node. Each scaled capacitor has a capacitance equal to 2(n)*a unit capacitance (CUNIT). The subtractor circuit includes a reference capacitor connected to ground and the difference output node, and a reset circuit configured to draw, in response to a received RESET signal, the difference output node to ground.

Abstract: A subtractor circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a difference output node to a voltage proportional to a difference between two received N-bit binary numbers. The subtractor circuit includes sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The subtractor circuit includes two sets of scaled capacitors, each capacitor of one set connected to an nth input of the corresponding set of N inputs and to the difference output node. Each scaled capacitor has a capacitance equal to 2(n)*a unit capacitance (CUNIT). The subtractor circuit includes a reference capacitor connected to ground and the difference output node, and a reset circuit configured to draw, in response to a received RESET signal, the difference output node to ground.

Abstract: An adder circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a sum output node to a voltage proportional to a sum of received N-bit binary numbers. The adder circuit includes sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The adder circuit includes sets of scaled capacitors, each capacitor connected to an nth input of the corresponding set of N inputs and to the sum output node. Each scaled capacitor has a capacitance equal to 2(n)*a unit capacitance (CUNIT). The adder circuit includes a reference capacitor connected to ground and the sum output node, and a reset circuit configured to draw, in response to a received RESET signal, the sum output node to ground.

Abstract: A subtractor circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a difference output node to a voltage proportional to a difference between two received N-bit binary numbers. The subtractor circuit includes sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The subtractor circuit includes two sets of scaled capacitors, each capacitor of one set connected to an nth input of the corresponding set of N inputs and to the difference output node. Each scaled capacitor has a capacitance equal to 2(n)*a unit capacitance (CUNIT). The subtractor circuit includes a reference capacitor connected to ground and the difference output node, and a reset circuit configured to draw, in response to a received RESET signal, the difference output node to ground.

Abstract: An adder circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a sum output node to a voltage proportional to a sum of received N-bit binary numbers. The adder circuit includes sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The adder circuit includes sets of scaled capacitors, each capacitor connected to an nth input of the corresponding set of N inputs and to the sum output node. Each scaled capacitor has a capacitance equal to 2(n)* a unit capacitance (CUNIT). The adder circuit includes a reference capacitor connected to ground and the sum output node, and a reset circuit configured to draw, in response to a received RESET signal, the sum output node to ground.

Abstract: An apparatus and methods for predicting and/or for calibrating memory yields due to process defects and/or device variations, including determining a model of a memory cell, identifying a subset of parameters associated with the model, determining and executing a refined model using the parameters, determining a predicted probability the simulated memory cell will be operational based on the simulated operation of the refined model, determining yield prediction information from the predicted probability, and determining the minimum number of repair elements to include in a memory array design to insure a desired yield percentage based on the yield prediction information.