Abstract: Exemplary systems and methods can be provided for measuring a parameter—e.g., channel impulse response and/or power delay profile—of a wideband, millimeter-wave (mmW) channel. The exemplary systems can include a receiver configured to receive a first signal from the channel, generate a second signal, and measure the parameter based on a comparison between the first and second signals; and a controller configured to determine first and second calibration of the system before and after measuring the parameter, and determine a correction for the parameter measurement based on the first and second calibrations. Exemplary methods can also be provided for calibrating a system for measuring the channel parameter. Such methods can be utilized for systems in which the TX and RX devices share a common frequency source and for systems in which the TX and RX devices have individual frequency sources that free-run during channel measurements.

Abstract: Exemplary systems and methods can be provided for measuring a parameter—e.g., channel impulse response and/or power delay profile—of a wideband, millimeter-wave (mmW) channel. The exemplary systems can include a receiver configured to receive a first signal from the channel, generate a second signal, and measure the parameter based on a comparison between the first and second signals; and a controller configured to determine first and second calibration of the system before and after measuring the parameter, and determine a correction for the parameter measurement based on the first and second calibrations. Exemplary methods can also be provided for calibrating a system for measuring the channel parameter. Such methods can be utilized for systems in which the TX and RX devices share a common frequency source and for systems in which the TX and RX devices have individual frequency sources that free-run during channel measurements.