Abstract: An X-Y scanner is illustrated which utilizes an eddy current or ultrasonic current test probe for detecting surface defects in small flat plates and the like. The apparatus includes a scanner C which travels on a pair of slide tubes (20) in the X-direction. The scanner is, in turn, carried on a carriage B which slides in the Y-direction. The scanner C is driven in the X-direction by means of a helix shaft (44) having a closed-loop helix groove (46) in which a follower pin 38 carried by scanner C rides. The carriage B is moved incrementally in the Y-direction upon the completion of travel of the scanner back and forth in the X-direction by means of an indexing means E which includes an indexing actuator (54) and an indexing gear (50). Actuator (54) is in the form of a ratchet which engages ratchet gear (52) upon return of the scanner to the indexing position whereupon the indexing gear (50) is rotated a predetermined increment along a rack gear (48) to move carriage B incrementally in the Y-direction.

Abstract: A tie locating device having a notched groove at one end for referencing the narrow end of the tie, and a sliding scale extending from the other end of the device having thereon a series of references, which, when the slide is extended, provide a plurality of selected reference marks from which one would be selected and used to align the wide end of the tie, thereby determining the length position of the tie ends for correct tying.