Patents by Inventor George Yefchak

George Yefchak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090108191
    Abstract: The gain of the ion detector of a mass spectrometer is calibrated by using the ion detector to measure a ratio of the abundances of at least two ion species having a known abundance ratio. The gain of the ion detector is changed until the measured abundance ratio matches the known abundance ratio.
    Type: Application
    Filed: October 30, 2007
    Publication date: April 30, 2009
    Inventors: George Yefchak, Kenneth L. Staton, Gangqiang Li
  • Publication number: 20080073499
    Abstract: Methods for processing low resolution mass spectrometry data, including providing the low resolution mass spectrometry data as abundance versus flight time data, converting the flight time axis of the low resolution mass spectrometry data to a calibrated mass axis, and converting that to retention time-based chromatographic data. The time-based data may then be converted back to abundance versus mass data and processed to create a mass spectrum.
    Type: Application
    Filed: July 25, 2006
    Publication date: March 27, 2008
    Inventors: George Yefchak, James H. Crabtree
  • Publication number: 20050126905
    Abstract: The invention provides a method for controlled fabrication of a solid state structural feature. In the method, a solid state structure is provided and the structure is exposed to an ion beam, under fabrication process conditions for producing the structural feature. A physical detection species is directed toward a designated structure location, and the rate at which the detection species proceeds from the designated structure location is measured. Detection species rate measurements are fit to a mathematical model, and the fabrication process conditions are controlled, based on the fitted detection species rate measurements, to fabricate the structural feature.
    Type: Application
    Filed: October 7, 2004
    Publication date: June 16, 2005
    Applicants: President and Fellows of Harvard College, Agilent Technologies, Inc.
    Inventors: Jene Golovchenko, Derek Stein, George Yefchak, Richard Pittaro, Curt Flory
  • Publication number: 20050022895
    Abstract: The present invention is directed to methods and apparatus for removing a gaseous bubble confined in a microvolume of liquid in a chamber. A source of liquid, a barrier region and an exit region are provided in fluid communication with the chamber. The source of liquid has an energy potential as regards movement of the gaseous bubble that is higher than the energy potential of the barrier region, the barrier region has a higher energy potential than the chamber, and the chamber has a higher energy potential than the exit region. The energy potential is reduced within the chamber, the source of liquid, the barrier region, and the exit region by an amount such that the energy within the gaseous bubble is sufficient to displace the gaseous bubble from the chamber through the barrier region and out the exit region and to fill the chamber with the liquid from the source.
    Type: Application
    Filed: July 30, 2003
    Publication date: February 3, 2005
    Inventors: Phillip Barth, George Yefchak
  • Patent number: 6700118
    Abstract: Adjustment systems, methods, computerized methods and computer readable-mediums that can be used in time-of-flight mass spectrometry (TOFMS) to account for thermal drift or mechanical strain are provided.
    Type: Grant
    Filed: August 15, 2001
    Date of Patent: March 2, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: George Yefchak, Carl Myerholtz, Gangqiang Li
  • Patent number: 6627874
    Abstract: Method and apparatus for rapid monitoring of pressure in a chamber equipped with a mass spectrometer by using the primary beam current in conjunction with a conventional pressure gauge. The conventional gauge allows frequent calibration of the relationship of the beam current to the chamber pressure, preventing excessive drift in the system. An advantage of the system is that it takes advantage of instruments already present in a typical spectrometry apparatus.
    Type: Grant
    Filed: March 7, 2000
    Date of Patent: September 30, 2003
    Assignee: Agilent Technologies, Inc.
    Inventor: George Yefchak
  • Publication number: 20030034448
    Abstract: Adjustment systems, methods, computerized methods and computer readable-mediums that can be used in time-of-flight mass spectrometry (TOFMS) to account for thermal drift or mechanical strain are provided.
    Type: Application
    Filed: August 15, 2001
    Publication date: February 20, 2003
    Inventors: George Yefchak, Carl Myerholtz, Gangqiang Li
  • Patent number: 6455845
    Abstract: A method of providing an ion packet to an analyzer section of a mass spectrometer from an ion beam, a pulser which can execute such a method, and a mass spectrometer which includes such a pulser. In the method, a field pulse is applied to extract an ion packet from the beam at a sideways direction to the beam and provide it to a mass analyzer section of the mass spectrometer, which pulse simultaneously causes non-extracted ions of the beam to be deflected onto an electrode of opposite charge. The pulse ON time is significantly longer than conventionally used. For example, the pulse ON time may be longer than the pulse OFF time or at least twice as long as or several times longer than required to extract the ion packet and provide it to the mass analyzer section, so as to reduce stray ions entering the mass analyzer section.
    Type: Grant
    Filed: April 20, 2000
    Date of Patent: September 24, 2002
    Assignee: Agilent Technologies, Inc.
    Inventors: Ganggiang Li, Carl A. Myerholtz, George Yefchak